Dr. Stefania Residori
Research Director at Institut de Physique de Nice
SPIE Involvement:
Conference Program Committee | Author
Publications (27)

Proceedings Article | 1 March 2019 Paper
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Signal to noise ratio, Ultrafast phenomena, Refractive index, Femtosecond phenomena, Doppler effect, Polarization, Interferometers, Liquid crystals, Two wave mixing, Phase shifts

Proceedings Article | 20 February 2017 Paper
Proc. SPIE. 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
KEYWORDS: Signal to noise ratio, Multimode fibers, Optical fibers, Optical components, Holography, Optical sensing, Digital holography, Phase modulation, Interferometers, Wavefronts, Phase shift keying, Liquid crystals, Holographic interferometry, Optically addressed spatial light modulators, Light valves, Holographic interferometers

Proceedings Article | 20 February 2017 Paper
Proc. SPIE. 10119, Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
KEYWORDS: Ultrafast phenomena, Hyperspectral imaging, Femtosecond phenomena, Molecules, Crystals, Interferometry, Temporal resolution, Liquid crystals, Spectral resolution, Ultrafast imaging

Proceedings Article | 23 September 2016 Paper
Proc. SPIE. 9940, Liquid Crystals XX
KEYWORDS: Holography, Optical sensing, Phase modulation, Modulation, Interferometers, Photodiodes, Phase shift keying, Adaptive optics, Liquid crystals, Optically addressed spatial light modulators

Proceedings Article | 7 March 2016 Paper
Proc. SPIE. 9763, Slow Light, Fast Light, and Opto-Atomic Precision Metrology IX
KEYWORDS: Holography, Optical sensing, Phase modulation, Interferometers, Sensors, Phase shift keying, Liquid crystals, Holographic interferometry, Optically addressed spatial light modulators, Holographic interferometers

Showing 5 of 27 publications
Conference Committee Involvement (7)
Optical and Quantum Sensing and Precision Metrology
6 March 2021 | Online Only, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
1 February 2020 | San Francisco, California, United States
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
2 February 2019 | San Francisco, California, United States
Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
29 January 2018 | San Francisco, California, United States
Slow Light, Fast Light, and Opto-Atomic Precision Metrology X
30 January 2017 | San Francisco, California, United States
Showing 5 of 7 Conference Committees
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