Dr. Stéphane Reyné
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 18 February 2013 Paper
Stéphane Mainguy, Jean-Philippe Airiau, Thierry Bart, Vincent Beau, Edouard Bordenave, Stéphane Bouillet, Christian Chappuis, Sandrine Chico, Philippe Cormont, Nathalie Darbois, Jérome Daurios, Vincent Denis, Laure Eupherte, Nathalie Ferriou-Darbois, Servane Fontaine, Gaël Gaborit, Claire Grosset-Grange, Eric Journot, Laurent Lamaignère, Thomas Lanternier, Eric Lavastre, Christophe Leymarié, Louis-André Lompré, Mélanie Mangeant, Cédric Maunier, Jérome Néauport, Etienne Perrot-Minnot, Gérard Razé, Stéphane Reyné, Claude Rouyer, Jean-Michel Sajer, Stéphane Seznec, Daniel Taroux, Sébastien Vermersch, Laurent Le Déroff
Proceedings Volume 8602, 86020G (2013) https://doi.org/10.1117/12.2004148
KEYWORDS: Wavefronts, Wave propagation, Optical components, Optical amplifiers, Laser optics, Mirrors, Numerical simulations, Spatial filters, Crystals, Near field optics

Proceedings Article | 21 February 2011 Paper
Proceedings Volume 7937, 79370L (2011) https://doi.org/10.1117/12.872855
KEYWORDS: Laser induced damage, Absorption, Crystals, National Ignition Facility, Mie scattering, Resistance, Ionization, Plasma, 3D modeling, Potassium

Proceedings Article | 29 November 2010 Paper
Proceedings Volume 7842, 78420T (2010) https://doi.org/10.1117/12.867234
KEYWORDS: Laser induced damage, Absorption, Crystals, National Ignition Facility, Mie scattering, CCD cameras, Resistance, Ionization, Plasma, 3D modeling

Proceedings Article | 29 November 2010 Paper
Proceedings Volume 7842, 784210 (2010) https://doi.org/10.1117/12.867982
KEYWORDS: Laser induced damage, Crystals, Second-harmonic generation, Polarization, Laser crystals, Absorption, Mie scattering, CCD cameras, Spherical lenses, 3D modeling

Proceedings Article | 31 December 2009 Paper
Proceedings Volume 7504, 75041C (2009) https://doi.org/10.1117/12.836346
KEYWORDS: Laser induced damage, Beam shaping, Silica, Excimer lasers, Nd:YAG lasers, Data analysis, Metrology, Gaussian beams, Resistance, Beam analyzers

Showing 5 of 8 publications
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