Dr. Steve Solomon
President at Acumen Scientific
SPIE Involvement:
Author
Publications (29)

Proceedings Article | 6 June 2013 Paper
Proc. SPIE. 8715, Passive and Active Millimeter-Wave Imaging XVI
KEYWORDS: Signal to noise ratio, Weapons, Imaging systems, Reflectivity, Image resolution, Interferometry, Terahertz radiation, Phased arrays, Reconstruction algorithms, Improvised explosive devices

Proceedings Article | 11 April 2008 Paper
Proc. SPIE. 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
KEYWORDS: Infrared cameras, Infrared imaging, Cameras, Annealing, Resistance, Chromium, Time metrology, Projection systems, Infrared radiation, Array processing

Proceedings Article | 30 April 2007 Paper
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Thermography, Optical filters, Mirrors, Switching, Sensors, Projection systems, Bridges, Antennas, Tunable filters, Missiles

Proceedings Article | 30 April 2007 Paper
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Electronics, Avalanche photodetectors, Optical spheres, Cameras, Argon, Spectroscopy, Ultraviolet radiation, Projection systems, Optical microcavities, Plasma

Proceedings Article | 30 April 2007 Paper
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Nonuniformity corrections, Human-machine interfaces, Infrared imaging, Image processing, Video, Control systems, Signal processing, Projection systems, Infrared radiation, Convolution

Showing 5 of 29 publications
Conference Committee Involvement (4)
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIV
13 April 2009 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
17 March 2008 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
10 April 2007 | Orlando, Florida, United States
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
18 April 2006 | Orlando (Kissimmee), Florida, United States
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