Dr. Svorad Štolc
at AIT Austrian Institute of Technology GmbH
SPIE Involvement:
Author
Publications (6)

SPIE Journal Paper | 10 January 2017 Open Access
Kristián Valentín, Reinhold Huber-Mörk, Svorad Štolc
JEI, Vol. 26, Issue 01, 013004, (January 2017) https://doi.org/10.1117/12.10.1117/1.JEI.26.1.013004
KEYWORDS: Binary data, Line scan image sensors, Roads, Sensors, Image filtering, Cameras, 3D image processing, Calibration, Stereo vision systems, Associative arrays

Proceedings Article | 24 October 2016 Presentation + Paper
Kristián Valentín, Peter Wild, Svorad Štolc, Franz Daubner, Markus Clabian
Proceedings Volume 9995, 999503 (2016) https://doi.org/10.1117/12.2241169
KEYWORDS: Inspection, Calibration, Optical resolution, Infrared imaging, Ultraviolet radiation, Distortion, Light sources, Image processing, Image quality, Cameras

Proceedings Article | 4 March 2015 Paper
Daniel Soukup, Svorad Štolc, Reinhold Huber-Mörk
Proceedings Volume 9409, 94090R (2015) https://doi.org/10.1117/12.2080108
KEYWORDS: Bidirectional reflectance transmission function, Diffraction, Cameras, Diffraction gratings, Holograms, Photometry, Light emitting diodes, Inspection, Forensic science, Information security

SPIE Journal Paper | 15 October 2014
Svorad Štolc, Daniel Soukup, Branislav Holländer, Reinhold Huber-Mörk
JEI, Vol. 23, Issue 05, 053020, (October 2014) https://doi.org/10.1117/12.10.1117/1.JEI.23.5.053020
KEYWORDS: Cameras, Sensors, Imaging systems, Line scan image sensors, 3D acquisition, Inspection, 3D modeling, Computed tomography, Machine vision, Signal to noise ratio

Proceedings Article | 7 March 2014 Paper
Svorad Štolc, Reinhold Huber-Mörk, Branislav Holländer, Daniel Soukup
Proceedings Volume 9024, 902407 (2014) https://doi.org/10.1117/12.2042475
KEYWORDS: Cameras, Sensors, Line scan image sensors, Inspection, Spatial resolution, Imaging systems, 3D acquisition, 3D image processing, Signal to noise ratio, Visualization

Showing 5 of 6 publications
Conference Committee Involvement (1)
Image Processing: Machine Vision Applications VIII
10 February 2015 | San Francisco, California, United States
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