Dr. Szczesny B. Krasnicki Profile

Dr. Szczesny B. Krasnicki

Physicist at Argonne National Lab

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Publications (6)

Proceedings Article | 23 December 2003 Paper

Spatially resolved tilt and strain measurements in diamond crystals

Szczesny Krasnicki, Yuncheng Zhong, Jozef Maj, Albert Macrander

Proceedings Volume 5195, (2003) https://doi.org/10.1117/12.516621

KEYWORDS: Diamond, Crystals, Etching, Sensors, Charge-coupled devices, X-ray diffraction, X-rays, CCD image sensors, Polishing, Image resolution

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Proceedings Article | 5 January 2001 Paper

McCarter superfinish grinding for silicon: an update

Frank Anthony, Ali Khounsary, Douglas McCarter, S. Krasnicki, Matt Tangedahl

Proceedings Volume 4145, (2001) https://doi.org/10.1117/12.411655

KEYWORDS: Silicon, Crystals, X-rays, Particles, Wave plates, Surface finishing, Copper, X-ray diffraction, Etching, Diamond wheels

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Proceedings Article | 16 November 1999 Paper

Laterally graded multilayer double-monochromator

Albert Macrander, Jens Als-Nielsen, Chian Liu, S. Krasnicki, Jozef Maj, Derrick Mancini, Jenny Erdmann, P. Gaarde

Proceedings Volume 3773, (1999) https://doi.org/10.1117/12.370084

KEYWORDS: Monochromators, Chlorine, Reflectivity, Silicon, Grazing incidence, Diffraction, Glasses, X-rays, Interfaces, Reflection

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Proceedings Article | 11 December 1998 Paper

Pin-post monochromators for a wiggler beamline

Szczesny Krasnicki, Jozef Maj, Wilfried Schildkamp, Thomas Tonnessen

Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332524

KEYWORDS: Monochromators, Crystals, Silicon, Composites, X-rays, Californium, X-ray diffraction, Reflection, Collimation, Thermal engineering

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Proceedings Article | 11 December 1998 Paper

Specular and diffuse x-ray scattering from tungsten/carbon multilayers having a high reflectivity at 10 keV

Albert Macrander, Randall Headrick, Chian Liu, Jenny Erdmann, Ali Khounsary, Karl Smolenski, S. Krasnicki, Jozef Maj

Proceedings Volume 3448, (1998) https://doi.org/10.1117/12.332517

KEYWORDS: Scattering, Multilayers, Interfaces, Reflectivity, Diffraction, X-rays, Scatter measurement, Laser scattering, Correlation function, Crystal optics

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Proceedings Article | 11 December 1997 Paper

Progress in silicon-to-silicon direct bonding and its application to synchrotron x-ray optics

Timothy Graber, S. Krasnicki, Patricia Fernandez, Dennis Mills, Qin-Yi Tong, Ulrich Goesele

Proceedings Volume 3151, (1997) https://doi.org/10.1117/12.294498

KEYWORDS: Silicon, Crystals, Semiconducting wafers, X-ray optics, Wafer bonding, Monochromators, X-rays, Manufacturing, Laser crystals, Digital signal processing

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Showing 5 of 6 publications

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