Dr. Tae Bong Eom
at KRISS
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 13 May 2013 Paper
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Optical microscopes, Imaging systems, Interferometers, Calibration, Digital cameras, Computer programming, CCD cameras, Tablets, Distance measurement, Aluminum

Proceedings Article | 3 August 2010 Paper
Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis
KEYWORDS: Refractive index, Fabry–Perot interferometers, Fringe analysis, Silica, Interferometry, Wave plates, Refraction, Collimation, Solids, Helium neon lasers

Proceedings Article | 14 May 2010 Paper
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Optical components, Microscopes, Monochromatic aberrations, Point spread functions, Sensors, Calibration, Computer simulations, 3D metrology, Cylindrical lenses, Cerium

Proceedings Article | 10 September 2007 Paper
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Reflection, Scattering, Calibration, Light scattering, Surface roughness, Optical interferometry, Integrating spheres, System integration, Optical calibration, Phase shifts

Proceedings Article | 10 September 2007 Paper
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Mirrors, Ferroelectric materials, Metrology, Interferometers, Amplifiers, Field programmable gate arrays, Control systems, Dimensional metrology, Scanning probe microscopy, Motion measurement

Showing 5 of 14 publications
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