Prof. TaeHoon Kim
at KAIST
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 February 2006 Paper
Taehoon Kim, Taejoong Kim, SeungWoo Lee, Dae-Gab Gweon, Jungwoo Seo
Proceedings Volume 6090, 60900W (2006) https://doi.org/10.1117/12.646031
KEYWORDS: Signal to noise ratio, 3D modeling, Confocal microscopy, Microscopy, 3D image reconstruction, 3D image processing, 3D metrology, Image processing, Time metrology, Actuators

Proceedings Article | 23 February 2006 Paper
Proceedings Volume 6090, 60900X (2006) https://doi.org/10.1117/12.647395
KEYWORDS: Stimulated emission depletion microscopy, Microscopy, Optical filters, Numerical simulations, Confocal microscopy, Solids, Image resolution, Luminescence, Diffraction, Shape analysis

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