Dr. Takahiro Yasue
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 20 March 2010 Paper
Proceedings Volume 7636, 76360Q (2010) https://doi.org/10.1117/12.846474
KEYWORDS: Extreme ultraviolet, Extreme ultraviolet lithography, Line width roughness, Lithography, Deep ultraviolet, Polymers, Chemical reactions, Double patterning technology, Opacity, Photomasks

Proceedings Article | 11 December 2009 Paper
Proceedings Volume 7520, 75200R (2009) https://doi.org/10.1117/12.837341
KEYWORDS: Extreme ultraviolet lithography, Chromophores, Extreme ultraviolet, Lithography, Optical lithography, Optical transfer functions, Scanning electron microscopy, Electrons, Switches, Polymers

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