EUV resists have been developed to be able to print sub-30nm L/S features with EUV ADT having 0.25NA. However, a
lithographic performance especially line width roughness (LWR) of EUV resist is not comparable to that of DUV resist.
Shot noise effect has been regarded as a main reason for this poor performance of EUV resist [1-2]. Polymer bound PAG
with sensitizer is considered as one of solutions to overcome this problem. The champion resist based on polymer bound
PAG shows good performance at 30nm L/S and 27nm L/S patterns, although LWR is still worse than target. Additional
processes such as smoothing process, chemical treatment process and surfactant rinse process are evaluated. Surfactant
rinse process which can improve LWR and pattern collapse simultaneously is regarded as a best solution. A new resist
which can overcome out-of band radiation problem is required for EUV lithography. A resist which is totally transparent
at DUV or a resist which is very opaque at DUV wavelength is expected to be a solution for OOB problem of EUV
Recent advances in EUVL lithography is mainly centered on improving the RLS trade-off by employing new resist
platforms, bulkier PAGs, EUV sensitizers etc. Among the several new kinds of PAGs proposed till date, the focus of
development was mainly on the acid strength, compatibility with resin etc., whilst always retaining the mono, Di or tri
phenyl chromophore of the PAG. Herein we report on the use of chromophore-less PAG for the patterning of EUVL
resists. Resist performance using model acrylate and PHS based resist was studied. The patterned resists were
characterized using SEM. Thermal stability of the PAG was compared with model chromophore containing PAG.