Prof. Takamasa Suzuki
Professor at Niigata Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (98)

Proceedings Article | 8 December 2022 Paper
Haosen Pu, Osami Sasaki, Takamasa Suzuki, Samuel Choi
Proceedings Volume 12480, 124800B (2022) https://doi.org/10.1117/12.2660168
KEYWORDS: Spiral phase plates, Phase shift keying, Interferometry, Scanning probe microscopy, Phase measurement, Optical vortices, Spatial light modulators, Phase modulation, Gaussian beams, Computer generated holography

Proceedings Article | 1 November 2021 Paper
Takamasa Suzuki, Jiro Shimazaki, Osami Sasaki, Samuel Choi
Proceedings Volume 12057, 120574L (2021) https://doi.org/10.1117/12.2606987
KEYWORDS: Signal detection, Continuous wavelet transforms, Mirrors, Optical coherence tomography, Signal processing, Ferroelectric materials, Continuous wave operation, Wavelets, 3D metrology, Light sources

Proceedings Article | 9 October 2021 Presentation + Paper
Kaining Zhang, Samuel Choi, Osami Sasaki, Songjie Luo, Takamasa Suzuki, Jixiong Pu
Proceedings Volume 11899, 118990A (2021) https://doi.org/10.1117/12.2601233
KEYWORDS: Signal detection, Glasses, Fourier transforms, Interferometers, Spectral resolution, Phase measurement

SPIE Journal Paper | 26 March 2020
OE, Vol. 59, Issue 03, 034112, (March 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.3.034112
KEYWORDS: Interferometers, Phase shifts, Signal detection, CCD cameras, Digital signal processing, Cameras, Signal processing, Optical engineering, Phase shift keying, Modulation

Proceedings Article | 20 December 2019 Paper
Takamasa Suzuki, Nariyasu Sugawara, Samuel Choi
Proceedings Volume 11209, 1120922 (2019) https://doi.org/10.1117/12.2547786
KEYWORDS: Continuous wavelet transforms, Diffraction gratings, Optical coherence tomography, Semiconductor lasers, Diffraction, Mirrors, Wavelets, Glasses, Ferroelectric materials, Light sources

Showing 5 of 98 publications
Conference Committee Involvement (19)
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Technology and Measurement for Industrial Applications Conference
17 April 2023 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Showing 5 of 19 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top