Prof. Takamasa Suzuki
Professor at Niigata Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (95)

SPIE Journal Paper | 26 March 2020
OE Vol. 59 Issue 03
KEYWORDS: Interferometers, Phase shifts, Signal detection, CCD cameras, Digital signal processing, Cameras, Signal processing, Optical engineering, Phase shift keying, Modulation

Proceedings Article | 20 December 2019 Paper
Proc. SPIE. 11209, Eleventh International Conference on Information Optics and Photonics (CIOP 2019)
KEYWORDS: Diffraction, Mirrors, Light sources, Ferroelectric materials, Optical coherence tomography, Glasses, Wavelets, Semiconductor lasers, Continuous wavelet transforms, Diffraction gratings

SPIE Journal Paper | 23 October 2019
OE Vol. 58 Issue 10
KEYWORDS: Semiconductor lasers, Continuous wavelet transforms, Optical coherence tomography, Diffraction gratings, Diffraction, Mirrors, Acousto-optics, Modulation, Wavelets, Ferroelectric materials

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Light sources, Continuous wave operation, Optical coherence tomography, Glasses, Optical testing, CCD cameras, Signal processing, 3D metrology, Signal detection, Continuous wavelet transforms

Proceedings Article | 8 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Light sources, Interferometers, Cameras, Fourier transforms, Photodiodes, Signal processing, Phase measurement, Signal detection, Bandpass filters

Showing 5 of 95 publications
Conference Committee Involvement (12)
Optical Technology and Measurement for Industrial Applications Conference
20 April 2021 | Chiba, Japan
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Optical Technology and Measurement for Industrial Applications Conference
22 April 2020 | Yokohama, Japan
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Technology and Measurement for Industrial Applications Conference
23 April 2019 | Yokohama, Japan
Showing 5 of 12 Conference Committees
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