CONFERENCE PROCEEDINGS
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Takashi Fuse
at Fujitsu Labs Ltd
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 6 March 2013 Paper
Defect inspection technology for a gloss-coated surface using patterned illumination
Tsuyoshi Nagato, Takashi Fuse, Tetsuo Koezuka
Proceedings Volume 8661, 866110 (2013) https://doi.org/10.1117/12.2001768
KEYWORDS: Inspection, Modulation, Coating, Phase shift keying, Phase shifts, Specular reflections, Optical systems, Defect inspection, Cameras, Reflectivity
Proceedings Article | 8 October 2004 Paper
Observation of nanometer-scale crystal grain orientation in ferroelectric thin films using polarization near-field scanning optical microscopy (NSOM)
Takashi Fuse, Fumiyuki Takahashi, Hiroyuki Tsukahara
Proceedings Volume 5515, (2004) https://doi.org/10.1117/12.559233
KEYWORDS: Ferroelectric materials, Polarization, Near field scanning optical microscopy, Crystals, Near field, Near field optics, Thin films, Polarizers, Sensors, Birefringence
Proceedings Article | 2 February 1998 Paper
Development of high-speed 3D inspection system for solder bumps
Youji Nishiyama, Hiroyuki Tsukahara, Yoshitaka Oshima, Fumiyuki Takahashi, Takashi Fuse, Tohru Nishino
Proceedings Volume 3306, (1998) https://doi.org/10.1117/12.301246
KEYWORDS: Inspection, Acoustics, Data acquisition, Semiconductor lasers, Monochromatic aberrations, Laser scanners, Sensors, Mirrors, Sensing systems, Diffraction
Proceedings Article | 3 October 1995 Paper
High-speed 3D inspection system for solder bumps
Hiroyuki Tsukahara, Youji Nishiyama, Fumiyuki Takahashi, Takashi Fuse, Moritoshi Ando, Tohru Nishino
Proceedings Volume 2597, (1995) https://doi.org/10.1117/12.223978
KEYWORDS: Inspection, Sensors, 3D image processing, 3D metrology, Image sensors, Laser development, Algorithm development, Image processing, Laser welding, CCD cameras
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