Prof. Takashi Nomura Profile

Prof. Takashi Nomura

Associate Professor at Toyama Prefectural Univ

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 20 November 2012 Paper

Dynamic measurements by the color grating projection method using a two-step Fourier transform method

Kazuhide Kamiya, Takashi Nomura, Ami Tanbo, Matsumoto Kimihisa, Tashiro Hatsuzou, Shinya Suzuki

Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II

KEYWORDS: Optical filters, Phase shifting, Fourier transforms, Image analysis, CCD cameras, Signal processing, Shape analysis, Signal generators, Testing and analysis, Bandpass filters

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Proceedings Article | 8 May 2001 Paper

Position-sensing grating interferometer for a specular object: analysis considering the aberration

Kazuhide Kamiya, Takashi Nomura, Seiichi Okuda, Hatsuzo Tashiro, Kazuo Yoshikawa

Proc. SPIE. 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)

KEYWORDS: Monochromatic aberrations, Mirrors, Interferometers, Error analysis, Wavefronts, Zernike polynomials, Facility engineering, Polysomnography, Diffraction gratings

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Proceedings Article | 7 May 1999 Paper

Improvement of precision in the analysis of a lateral shearing interferogram using integration

Seiichi Okuda, Takashi Nomura, Kazuhide Kamiya, Hiroshi Miyashiro, Kazuo Yoshikawa, Hatsuzo Tashiro

Proc. SPIE. 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99)

KEYWORDS: Photovoltaics, Interferometers, Error analysis, Wavefronts, Computer simulations, Zernike polynomials, Turbulence, Shape analysis, Optical engineering, Shearing interferometers

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Proceedings Article | 20 October 1992 Paper

Application of a fringe scanning method to zone-plate interferometry

Takashi Nomura, Hiroshi Miyashiro, Kazuhide Kamiya, Kazuo Yoshikawa, Hatsuzo Tashiro, Shigeo Ozono, Masane Suzuki

Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

KEYWORDS: Diffraction, Fringe analysis, Interferometers, Error analysis, Manufacturing, Interferometry, Optical testing, Shape analysis, Beam shaping, Diffraction gratings

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Proceedings Article | 20 October 1992 Paper

Analysis of zone-plate interference fringe pattern

Kazuhide Kamiya, Takashi Nomura, Hiroshi Miyashiro, Kazuo Yoshikawa, Hatsuzo Tashiro, Shigeo Ozono, Masane Suzuki

Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

KEYWORDS: Fringe analysis, Interferometers, Error analysis, Manufacturing, Fourier transforms, Interferometry, Systems engineering, Optics manufacturing, Cutting equipment, Fizeau interferometers

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Showing 5 of 6 publications

Conference Committee Involvement (1)

Optical Metrology and Inspection for Industrial Applications

18 October 2010 | Beijing, China

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