Prof. Takashi Nomura
Associate Professor at Toyama Prefectural Univ
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 20 November 2012 Paper
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Optical filters, Phase shifting, Fourier transforms, Image analysis, CCD cameras, Signal processing, Shape analysis, Signal generators, Testing and analysis, Bandpass filters

Proceedings Article | 8 May 2001 Paper
Proc. SPIE. 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)
KEYWORDS: Monochromatic aberrations, Mirrors, Interferometers, Error analysis, Wavefronts, Zernike polynomials, Facility engineering, Polysomnography, Diffraction gratings

Proceedings Article | 7 May 1999 Paper
Proc. SPIE. 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99)
KEYWORDS: Photovoltaics, Interferometers, Error analysis, Wavefronts, Computer simulations, Zernike polynomials, Turbulence, Shape analysis, Optical engineering, Shearing interferometers

Proceedings Article | 20 October 1992 Paper
Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
KEYWORDS: Diffraction, Fringe analysis, Interferometers, Error analysis, Manufacturing, Interferometry, Optical testing, Shape analysis, Beam shaping, Diffraction gratings

Proceedings Article | 20 October 1992 Paper
Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation
KEYWORDS: Fringe analysis, Interferometers, Error analysis, Manufacturing, Fourier transforms, Interferometry, Systems engineering, Optics manufacturing, Cutting equipment, Fizeau interferometers

Showing 5 of 6 publications
Conference Committee Involvement (1)
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
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