Takumi Mukai
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 October 2020 Presentation + Paper
Proceedings Volume 11552, 115520M (2020) https://doi.org/10.1117/12.2575305
KEYWORDS: Beam shaping, Optical testing, Image sensors, Light scattering, Opacity, Translucency, Sensors, Reflection, Laser scattering, Scattering

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