Dr. Takuya Kohno Profile

Dr. Takuya Kohno

at Japan Science and Technology Agency

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 12 September 2011 Paper

Current status of the [sup]171[/sup]Yb optical lattice clock at NMIJ, AIST

Masami Yasuda, Takuya Kohno, Kazumoto Hosaka, Hajime Inaba, Yoshiaki Nakajima, Daisuke Akamatsu, Feng-Lei Hong

Proceedings Volume 8132, 81320F (2011) https://doi.org/10.1117/12.892642

KEYWORDS: Chemical species, Clocks, Laser stabilization, Ytterbium, Optical lattice clocks, Fiber lasers, Frequency combs, Signal to noise ratio, Strontium, Spectroscopy

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Proceedings Article | 26 August 2009 Paper

Development of an Yb optical lattice clock using a fermionic isotope

Masami Yasuda, Takuya Kohno, Kazumoto Hosaka, Hajime Inaba, Yoshiaki Nakajima, Atsushi Onae, Hidetoshi Katori, Feng-Lei Hong

Proceedings Volume 7431, 74310G (2009) https://doi.org/10.1117/12.825706

KEYWORDS: Chemical species, Clocks, Ytterbium, Fiber lasers, Optical lattice clocks, Laser stabilization, Spectroscopy, Bragg cells, Temperature metrology, Optical fibers

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Proceedings Article | 12 September 2007 Paper

Present status of the development of an Yb optical lattice clock at NMIJ/AIST (National Metrology Institute of Japan / National Institute of Advanced Industrial Science and Technology)

Masami Yasuda, Feng-Lei Hong, Takuya Kohno, Hajime Inaba, Kazumoto Hosaka, Christina Willis, Takayuki Kurosu, Atsushi Onae, Shin-ichi Ohshima

Proceedings Volume 6673, 66730D (2007) https://doi.org/10.1117/12.733047

KEYWORDS: Ytterbium, Fiber lasers, Laser systems engineering, Optical lattice clocks, Semiconductor lasers, Chemical species, Clocks, Metrology, Strontium, Laser sources

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Proceedings Article | 26 July 1999 Paper

Higher-order aberration measurement with printed patterns under extremely reduced sigma illumination

Hiroshi Nomura, Kazuo Tawarayama, Takuya Kohno

Proceedings Volume 3679, (1999) https://doi.org/10.1117/12.354348

KEYWORDS: Monochromatic aberrations, Zernike polynomials, Semiconducting wafers, Inspection, Lithography, Lithographic illumination, Overlay metrology, Excimer lasers, Laser scanners, 3D scanning

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