Mr. Tal Naor Profile

Tal Naor

at Technion-Israel Institute of Technology

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 5 March 2021 Presentation

3D microscopy in extreme conditions: in-flow or at high density

Yoav Shechtman, Elias Nehme, Boris Ferdman, Omer Adir, Racheli Gordon-Soffer, Reut Orange, Tal Naor, Yael Shalev-Ezra, Sarah Goldberg, Onit Alalouf, Daniel Freedman, Avi Schroeder, Tomer Michaeli, Lucien Weiss

Proceedings Volume 11654, 116540R (2021) https://doi.org/10.1117/12.2582466

KEYWORDS: Microscopy, 3D image processing, Imaging systems, Stereoscopy, Point spread functions, Yeast, Optical components, Neural networks, Nanoparticles, Molecules

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years