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Dr. Tanfer Yandayan
Chief Research Scientist at TUBITAK UME
SPIE Involvement:
Author
Publications (5)
Proceedings Article | 9 September 2019 Paper
A precise aperture centring device (ACenD) for autocollimator-based surface measuring profilers
Proceedings Volume 11109, 1110902 (2019) https://doi.org/10.1117/12.2531613
KEYWORDS: Calibration, Autocollimators, Distance measurement, Charge-coupled devices, Reticles, CCD cameras, Objectives, Metrology, Mirrors, Beam splitters
Proceedings Article | 7 September 2017 Presentation + Paper
Recent developments in nanoradian-angle metrology
Proceedings Volume 10385, 1038509 (2017) https://doi.org/10.1117/12.2274192
KEYWORDS: Autocollimators, Metrology, Calibration, Measurement devices, X-ray optics, X-rays, Synchrotrons, Space telescopes, Telescopes, Mirrors
Proceedings Article | 7 September 2017 Paper
A portable device for calibration of autocollimators with nanoradian precision
Proceedings Volume 10385, 103850B (2017) https://doi.org/10.1117/12.2274178
KEYWORDS: Calibration, Autocollimators, Metrology, X-rays, Precision calibration, Synchrotrons, Inspection, X-ray optics, Optical components, Synchrotron radiation
Proceedings Article | 5 September 2014 Paper
Pushing the limits: latest developments in angle metrology for the inspection of ultra-precise synchrotron optics
Proceedings Volume 9206, 92060F (2014) https://doi.org/10.1117/12.2060953
KEYWORDS: Autocollimators, Calibration, Metrology, Computer programming, Mirrors, Inspection, Synchrotrons, Head, Optical testing, Optics manufacturing
Proceedings Article | 20 November 2003 Paper
5-m measurement system for traceable measurements of tapes and rules
Proceedings Volume 5190, (2003) https://doi.org/10.1117/12.505579
KEYWORDS: Computer programming, Interferometers, Calibration, Temperature metrology, Laser optics, Cameras, Error analysis, Standards development, Manufacturing, Aluminum
Conference Committee Involvement (5)
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VII
6 August 2017 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VI
29 August 2016 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics V
18 August 2014 | San Diego, California, United States
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