Dr. Tatiana Berdinskikh Profile

Dr. Tatiana Berdinskikh

at SENKO Advanced Components Inc

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Author

Publications (5)

Proceedings Article | 28 January 2017 Presentation + Paper

MPI investigation for 40G NRZ link with low-RL cable assemblies

Toshiaki Satake, Tatiana Berdinskikh, Rutsuda Thongdaeng, Pitak Faysanyo, Michael Gurreri

Proceedings Volume 10131, 101310F (2017) https://doi.org/10.1117/12.2251060

KEYWORDS: Single mode fibers, Connectors, Polarization, Data centers, Semiconductor lasers, Signal attenuation, Optical fibers, Resistance, Network architectures, Receivers, Transmitters, Transmittance, Fiber lasers

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Proceedings Article | 24 October 2012 Paper

Investigation on impact of connector scratches on 40G NRZ Optical link performance

Tatiana Berdinskikh, Rutsuda Thongdaeng, Vittawat Phunnarungsi, Mike Gurreri, Joshua Webb, Andrzej Tymecki, Matt Brown, Giorgio Friedrich

Proceedings Volume 8412, 84120L (2012) https://doi.org/10.1117/12.2000386

KEYWORDS: Connectors, Eye, Picosecond phenomena, Polishing, Optical amplifiers, Optics manufacturing, Receivers, Optical fibers, Roads, Optical fiber cables

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Proceedings Article | 5 August 2009 Paper

Correlation study between contamination and signal degradation in single-mode APC connectors

Steve Lytle, Matt Brown, Tatiana Berdinskikh, Douglas Wilson, David Fisher, Sun-Yuan Huang, Mike Hughes, Tom Mitcheltree, Brian Roche

Proceedings Volume 7386, 73861W (2009) https://doi.org/10.1117/12.837545

KEYWORDS: Connectors, Contamination, Particles, Inspection, Cladding, Diffractive optical elements, Signal attenuation, Fiber optics, Electronics, Manufacturing

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This paper summarizes the correlation study between contamination and scratches on singlemode APC connectors and signal degradation; leading to an Acceptance Criteria Matrix. The study is a continuation of International Electronics Manufacturing Initiative (iNEMI) research on development of cleanliness specification for singlemode angled physical contact (SM-APC) connectors. Twenty-five APC SC connectors on one-meter patch cords were used for this study. The Design of the Experiment (DoE) was a multi-step process that involved: (1) inspecting, cleaning and inspecting connectors being tested (devices under test, or DUTs) and launch connectors; (2) making multiple matings and dematings of each DUT, in a pristine state, with a reference connector, and recording Return Loss (RL) data after each cycle; (3) manually applying dust to the cleaned end-faces of the DUTs; then (4) mating contaminated DUTs with clean reference connectors at least five times, taking RL measurements after each mating and saving fiber end-face images for both connectors. It was shown that connectors with the contamination at the core (9um diameter) demonstrated a dramatic decrease in average RL of 14.2 dB. In comparison, the samples with contamination on the cladding and clear core demonstrated a negligible change in RL of 0.15 dB. For highly contaminated samples in the cladding layer, we found the changes of RL to be about 5-6 dB. Further investigation established that particle migration during successive matings also occurs on the ferrule within the contact zone (approximately <250 μm in diameter). Polishing scratches had no impact on RL of APC connectors. Based on the experimental data described in this paper, an inspection criteria matrix is proposed for SM-APC connectors including the zone definitions and number of allowable defects (contamination and scratches) for each zone. The recommendations on pass/fail criteria have been provided to the IEC (International Electrotechnical Committee). It is expected IEC-61300-3-25, which contains these criteria, will publish in 2009.

Proceedings Article | 12 October 2005 Paper

Contamination influence on receptacle type optical data links

Scott Takahashi, Yutaka Sadohara, Carla Gleason, Tatiana Berdinskikh, Thomas Mitcheltree, Steve Lytle

Proceedings Volume 5970, 597004 (2005) https://doi.org/10.1117/12.632205

KEYWORDS: Contamination, Connectors, Single mode fibers, Time metrology, Optics manufacturing, Transmitters, Statistical analysis, Manufacturing, Inspection, Tolerancing

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Proceedings Article | 17 February 2003 Paper

Role of electrostatic charge effect on the contamination of fiber optic connectors and the ways of eliminating it

Tatiana Berdinskikh, Anatoliy Fisenko, Joe Daniel, Jason Bragg, Daniel Phillips

Proceedings Volume 4833, (2003) https://doi.org/10.1117/12.475352

KEYWORDS: Connectors, Contamination, Particles, Fiber optics, Iron, Inspection, Manufacturing, Optics manufacturing, Nickel, FT-IR spectroscopy

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