Cornerstone Research Group Inc. (CRG) has developed environmental exposure tracking (EET) sensors using shape
memory polymers (SMP) to monitor the degradation of perishable items, such as munitions, foods and beverages, or
medicines, by measuring the cumulative exposure to temperature and moisture. SMPs are polymers whose qualities have
been altered to give them dynamic shape "memory" properties. Under thermal or moisture stimuli, the SMP exhibits a
radical change from a rigid thermoset to a highly flexible, elastomeric state. The dynamic response of the SMP can be
tailored to match the degradation profile of the perishable item. SMP-based EET sensors require no digital memory or
internal power supply and provide the capability of inexpensive, long-term life cycle monitoring of thermal and moisture
exposure over time.
This technology was developed through Phase I and Phase II SBIR efforts with the Navy. The emphasis of current
research centers on transitioning SMP materials from the lab bench to a production environment. Here, CRG presents the
commercialization progress of thermally-activated EET sensors, focusing on fabrication scale-up, process refinements,
and quality control. In addition, progress on the development of vapor pressure-responsive SMP (VPR-SMP) will be
discussed.
Cornerstone Research Group Inc. (CRG) has developed environmental exposure tracking (EET) sensors using
shape memory polymer (SMP) to monitor the degradation of perishable items, such as munitions, medicines or foods, by
measuring the cumulative exposure to temperature and moisture. SMPs are polymers whose qualities have been altered
to give them dynamic shape "memory" properties. Under thermal or moisture stimuli, SMP exhibits a radical change
from a rigid thermoset to a highly flexible, elastic state. The dynamic response of the SMP can be tailored to match the
degradation profile of the perishable item. SMP-based EET sensors require no digital memory or internal power supply
and provide the capability of inexpensive, long-term life cycle monitoring thermal and moisture exposure over time.
In a Phase I and II SBIR effort with the Navy, CRG demonstrated the feasibility of SMP-based EET sensor
with two material systems. These material systems required different activation stimuli, heat or water vapor pressure.
CRG developed the ability to tailor these materials to customize the dynamic response to match various degradation
profiles of munitions. CRG optimized and characterized the SMP formulations and sensor design configuration to
develop a suite of data from which any degradation profile can be met. CRG's EET sensors are capable of monitoring
temperatures from -30 °C to 260 °C. The prototypes monitor cumulative thermal exposure and provide real-time
information in a visually readable or a remotely interrogated version. CRG is currently scaling up the manufacture of the
sensors for munitions reliability applications with the Navy.
Research and development efforts at Cornerstone Research Group Inc. (CRG) have led to commercialization efforts
on several projects where shape memory polymer (SMP) materials are being transitioned from laboratory development
to manufacturing and production. During this process, quality-control efforts are of vital importance for successfully
implementing smart materials technologies in commercial applications. Here, CRG reports quality-control procedures
being developed for mass production of environmental exposure sensors. These measures include chemical analysis
procedures for insuring resin quality at the front-end of the production line as well as back-end quality-assurance tests
for production validation on the SMP product.
Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks.
You are receiving this notice because your organization may not have SPIE eBooks access.*
*Shibboleth/Open Athens users─please
sign in
to access your institution's subscriptions.
To obtain this item, you may purchase the complete book in print or electronic format on
SPIE.org.
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.