Dr. Terry E. Sale
at Broadcom Inc
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 27 February 2014 Paper
Thomas Fanning, Jingyi Wang, Zheng-Wen Feng, Mark Keever, Chen Chu, Aaditya Sridhara, Cesare Rigo, Hairong Yaun, Terry Sale, Gim-Hong Koh, Ramana Murty, Samir Aboulhouda, Laura Giovane
Proceedings Volume 9001, 900102 (2014) https://doi.org/10.1117/12.2039499
KEYWORDS: Vertical cavity surface emitting lasers, Reliability, Oxides, Indium gallium arsenide, Quantum wells, Semiconducting wafers, Modulation, Temperature metrology, Manufacturing, Optics manufacturing

Proceedings Article | 13 March 2013 Paper
Jingyi Wang, Mark Keever, Zheng-Wen Feng, Thomas Fanning, Chen Chu, Aadi Sridhara, Friedhelm Hopfer, Terry Sale, An-Nien Cheng, Bing Shao, Li Ding, Pengyue Wen, Hsu-Hao Chang, Charlie Wang, David Chak Wang Hui, Laura Giovane
Proceedings Volume 8639, 86390K (2013) https://doi.org/10.1117/12.2004521
KEYWORDS: Vertical cavity surface emitting lasers, Modulation, Oxides, Temperature metrology, Eye, Reliability, Transceivers, Optics manufacturing, Data communications, Resistance

Proceedings Article | 13 March 2013 Paper
M. V. Ramana Murty, L. Giovane, S. Ray, K. -L. Chew, M. Crom, T. Sale, A. Sridhara, C. Zhao, Chu Chen, T. Fanning
Proceedings Volume 8639, 863902 (2013) https://doi.org/10.1117/12.2005392
KEYWORDS: Vertical cavity surface emitting lasers, Diodes, Modulation, Lithium, Laser damage threshold, Quantum wells, Temperature metrology, Measurement devices, Laser development, Reverse modeling

Proceedings Article | 8 February 2011 Paper
Jingyi Wang, Chen Ji, David Soderstrom, Tong Jian, Laura Giovane, Sumon Ray, Zheng-Wen Feng, Friedhelm Hopfer, Jeong-Ki Hwang, Terry Sale, Sumitro Joyo Taslim, Chen Chu
Proceedings Volume 7952, 795205 (2011) https://doi.org/10.1117/12.875098
KEYWORDS: Vertical cavity surface emitting lasers, Oxides, Modulation, Reliability, Temperature metrology, Transceivers, Quantum wells, Fiber optics, Standards development, Eye

Proceedings Article | 6 February 2010 Paper
Terry Sale, Chen Chu, Jeong-Ki Hwang, Gim-Hong Koh, Rashit Nabiev, Jason Tan, Laura Giovane, Ramana Murty
Proceedings Volume 7615, 761503 (2010) https://doi.org/10.1117/12.845077
KEYWORDS: Semiconducting wafers, Vertical cavity surface emitting lasers, Manufacturing, Process control, Wafer-level optics, Optics manufacturing, Reliability, Control systems, Wafer testing, Oxidation

Showing 5 of 12 publications
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