In this study, we develop a shutter-less algorithm for a silicon-on-insulator (SOI) diode uncooled infrared focal plane array (IRFPA). The optimal non-uniformity correction is calculated onboard. The effectiveness of the proposed algorithm was verified using a prototype uncooled IR camera. The performance of the shutter-less algorithm was studied by measuring a fixed pattern noise (FPN) at different correction points and verification of favorable camera operation. Even at two correction points, the FPN was at a practical level. The temperature behavior of the proposed SOI diode is highly uniform and predictable, which leads to simpler device modeling and therefore simpler shutter-less operation. A new pixel structure was also developed for pixel size reduction. This approach is based on the realization of a novel thermal isolation structure that can be fabricated by post processing on top of CMOS wafers. Ten series diodes can be arranged in a pixel by designing a 12 μm pixel pitch IRFPA with the new pixel structure. These developed technologies have significantly enhanced the performance of the SOI diode uncooled IRFPA, which inherently possesses excellent uniformity and low noise.
We develop a shutter-less method for replacing mechanical shutters. To verify the effectiveness of the proposed method, we fabricated a silicon-on-insulator (SOI) diode uncooled 320 × 240 infrared focal plane array (IRFPA) with 17 μm pixel pitch utilizing a circuit architecture that achieves thermo-electric cooling (TEC)-less operation. Furthermore, we fabricated a prototype uncooled IR camera that implements the proposed method and verified favorable camera operation. The temperature behavior of our proposed SOI diode is highly uniform and predictable, which enables simpler device modeling and consequently simpler TEC-less and shutter-less operation.