Dr. Thomas James Belich Profile

Dr. Thomas James Belich

at Univ of Minnesota Twin Cities

SPIE Involvement:

Author

Publications (3)

Proceedings Article | 23 May 2005 Paper

Conductance fluctuations in free-standing hydrogenated amorphous silicon nanoparticles

Thomas Belich, Zhe Shen, Charlie Blackwell, Stephen Campbell, James Kakalios

Proceedings Volume 5843, (2005) https://doi.org/10.1117/12.609498

KEYWORDS: Nanoparticles, Particles, Amorphous silicon, Plasma, Electrodes, Silicon, Silicon films, Transmission electron microscopy, Plasma enhanced chemical vapor deposition, Dielectrics

Read Abstract +

Proceedings Article | 9 May 2003 Paper

Non-Gaussian 1/f noise as a probe of long-range structural and electronic disorder in amorphous silicon

Thomas Belich, Zhe Shen, Stephen Campbell, James Kakalios

Proceedings Volume 5112, (2003) https://doi.org/10.1117/12.489025

KEYWORDS: Temperature metrology, Amorphous silicon, Hydrogen, Silicon, Particles, Silicon films, Electrodes, Statistical modeling, Doping, Plasma

Read Abstract +

Proceedings Article | 13 July 1998 Paper

Calculation of the contribution of the nonuniformity of the scene projector to the nonuniformity of the output image of a test article

Brian Beecken, T. James Belich

Proceedings Volume 3368, (1998) https://doi.org/10.1117/12.316361

KEYWORDS: Sensors, Projection systems, Detector arrays, Optical alignment, Signal detection, Software, Staring arrays, Infrared imaging, Infrared radiation, Optical components

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years