Thomas M. Daunais
MS Graduate Student at Michigan Technological Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 February 2011 Paper
Proc. SPIE. 7941, Integrated Optics: Devices, Materials, and Technologies XV
KEYWORDS: Lithography, Refractive index, Waveguides, Cladding, Polymers, Glasses, Ultraviolet radiation, Refraction, Optics manufacturing, Absorption

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