Thomas Egloff
at Fraunhofer-Institut für Photonische Mikrosysteme
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 29 April 2009 Paper
Proc. SPIE. 7319, Next-Generation Spectroscopic Technologies II
KEYWORDS: Microelectromechanical systems, Near infrared, Indium gallium arsenide, Imaging systems, Sensors, Spectroscopy, Spectrometers, Imaging spectroscopy, Signal processing, Process control

Proceedings Article | 24 February 2009 Paper
Proc. SPIE. 7208, MOEMS and Miniaturized Systems VIII
KEYWORDS: Microelectromechanical systems, Microscopes, Mirrors, Sensors, Scanners, Luminescence, Raman spectroscopy, Scanning probe microscopy, Signal detection, Photonic microstructures

Proceedings Article | 27 September 2008 Paper
Proc. SPIE. 7100, Optical Design and Engineering III
KEYWORDS: Microelectromechanical systems, Near infrared, Indium gallium arsenide, Digital signal processing, Sensors, Spectrometers, Bioalcohols, Control systems, Signal processing, Signal detection

Proceedings Article | 8 February 2008 Paper
Proc. SPIE. 6887, MOEMS and Miniaturized Systems VII
KEYWORDS: Hyperspectral imaging, Near infrared, Mirrors, Imaging systems, Spectroscopy, Imaging spectroscopy, Detector arrays, Collimators, Microopto electromechanical systems, Diffraction gratings

Proceedings Article | 2 October 2007 Paper
Proc. SPIE. 6765, Next-Generation Spectroscopic Technologies
KEYWORDS: Hyperspectral imaging, Near infrared, Mirrors, Imaging systems, Spectroscopy, Imaging spectroscopy, Detector arrays, Collimators, Microopto electromechanical systems, Diffraction gratings

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