Unspecified Thomas R. Fanning Profile

Thomas R. Fanning

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Publications (9)

Proceedings Article | 24 February 2020 Paper

Performance, manufacturability, and qualification advances of high-power VCSEL arrays at TriLumina Corporation

Thomas Fanning, John Maynard, Christopher Helms, Lei Yang, David Podva, Jeff Earls, Jacob Lopez, Michael Chung, James Foresi, Mial Warren, Gianluca Bacchin

Proc. SPIE. 11300, Vertical-Cavity Surface-Emitting Lasers XXIV

KEYWORDS: LIDAR, Particles, Manufacturing, Reliability, Humidity, Epitaxy, Vertical cavity surface emitting lasers, Semiconducting wafers, Standards development, 3D-TOF imaging

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Proceedings Article | 25 February 2017 Paper

50Gb/s PAM-4 oxide VCSEL development progress at Broadcom

Jingyi Wang, M. V. Ramana Murty, Charlie Wang, David Hui, Ann Lehman Harren, Hsu-Hao Chang, Zheng-Wen Feng, Thomas Fanning, Aaditya Sridhara, Sumitro-Joyo Taslim, Xinle Cai, Jason Chu, Laura Giovane

Proc. SPIE. 10122, Vertical-Cavity Surface-Emitting Lasers XXI

KEYWORDS: Oxides, Transceivers, Eye, Quantum wells, Modulation, Manufacturing, Reliability, Optoelectronics, Vertical cavity surface emitting lasers, Forward error correction, Data communications, Optical interconnects, Temperature metrology

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Proceedings Article | 4 March 2015 Paper

Mode partition noise characterization of 25 Gb/s VCSELs

M. V. Ramana Murty, David Cunningham, Laura Giovane, Jingyi Wang, Zheng-Wen Feng, Thomas Fanning

Proc. SPIE. 9381, Vertical-Cavity Surface-Emitting Lasers XIX

KEYWORDS: Signal to noise ratio, Eye, Fabry–Perot interferometers, Modulation, Dispersion, Interference (communication), Receivers, Transmittance, Vertical cavity surface emitting lasers, Filtering (signal processing)

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Proceedings Article | 27 February 2014 Paper

28-Gbps 850-nm oxide VCSEL development and manufacturing progress at Avago

Thomas Fanning, Jingyi Wang, Zheng-Wen Feng, Mark Keever, Chen Chu, Aaditya Sridhara, Cesare Rigo, Hairong Yaun, Terry Sale, Gim-Hong Koh, Ramana Murty, Samir Aboulhouda, Laura Giovane

Proc. SPIE. 9001, Vertical-Cavity Surface-Emitting Lasers XVIII

KEYWORDS: Oxides, Indium gallium arsenide, Quantum wells, Modulation, Manufacturing, Reliability, Vertical cavity surface emitting lasers, Semiconducting wafers, Optics manufacturing, Temperature metrology

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Proceedings Article | 13 March 2013 Paper

28 Gb/s 850 nm oxide VCSEL development at Avago

Jingyi Wang, Mark Keever, Zheng-Wen Feng, Thomas Fanning, Chen Chu, Aadi Sridhara, Friedhelm Hopfer, Terry Sale, An-Nien Cheng, Bing Shao, Li Ding, Pengyue Wen, Hsu-Hao Chang, Charlie Wang, David Chak Wang Hui, Laura Giovane

Proc. SPIE. 8639, Vertical-Cavity Surface-Emitting Lasers XVII

KEYWORDS: Oxides, Transceivers, Eye, Modulation, Reliability, Resistance, Vertical cavity surface emitting lasers, Data communications, Optics manufacturing, Temperature metrology

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Proceedings Article | 13 March 2013 Paper

VCSELs for high-speed data networks

M. V. Ramana Murty, L. Giovane, S. Ray, K. -L. Chew, M. Crom, T. Sale, A. Sridhara, C. Zhao, Chu Chen, T. Fanning

Proc. SPIE. 8639, Vertical-Cavity Surface-Emitting Lasers XVII

KEYWORDS: Quantum wells, Lithium, Modulation, Laser development, Diodes, Measurement devices, Laser damage threshold, Vertical cavity surface emitting lasers, Temperature metrology, Reverse modeling

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Proceedings Article | 7 February 2009 Paper

New developments in 850 and 1300nm VCSELs at JDSU

Luke Graham, Melinda Schnoes, Kevin Maranowski, Thomas Fanning, Max Crom, Stewart Feld, Matthew Gray, Karen Bowers, Steve Silva, Kirk Cook, Gayle Schomberger, Ben Gable

Proc. SPIE. 7229, Vertical-Cavity Surface-Emitting Lasers XIII

KEYWORDS: Wafer-level optics, Oxides, Transceivers, Reliability, Photomasks, Vertical cavity surface emitting lasers, Semiconducting wafers, Failure analysis, Standards development, Temperature metrology

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Proceedings Article | 12 February 2008 Paper

LW VCSELs for SFP+ applications

Luke Graham, Jack Jewell, Kevin Maranowski, Max Crom, Stewart Feld, Joseph Smith, James Beltran, Thomas Fanning, Melinda Schnoes, Matthew Gray, David Droege, Vera Koleva, Mike Dudek, John Fiers, Russ Patterson

Proc. SPIE. 6908, Vertical-Cavity Surface-Emitting Lasers XII

KEYWORDS: Code division multiplexing, Wafer-level optics, Oxides, Transceivers, Eye, Reliability, Vertical cavity surface emitting lasers, Chlorine, Semiconducting wafers, Temperature metrology

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Proceedings Article | 10 February 2006 Paper

1310nm VCSELs in 1-10Gb/s commercial applications

Jack Jewell, Luke Graham, Max Crom, Kevin Maranowski, Joseph Smith, Tom Fanning

Proc. SPIE. 6132, Vertical-Cavity Surface-Emitting Lasers X

KEYWORDS: Transceivers, Optical filters, Error analysis, Reliability, Laser applications, Laser marking, Single mode fibers, Vertical cavity surface emitting lasers, Semiconducting wafers, Temperature metrology

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Showing 5 of 9 publications

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