Thomas Käsebier
at Friedrich-Schiller-Univ Jena
SPIE Involvement:
Author
Publications (21)

Proceedings Article | 13 March 2024 Presentation
Reinhard Geiss, Andre Steinbach, Mohammadreza Younesi, Johannes Mühlenstädt, Thomas Käsebier, Frank Setzpfandt, Thomas Siefke, Thomas Pertsch, Falk Eilenberger
Proceedings Volume PC12889, PC128890Q (2024) https://doi.org/10.1117/12.3000981
KEYWORDS: Lithium niobate, Fabrication, Integrated photonics, Waveguides, Quantum technology applications, Quantum processes, Wafer-level optics, Thin films, Semiconducting wafers, Quantum technologies

Proceedings Article | 26 April 2019 Presentation + Paper
David Schmelz, Martin Steglich, Kay Dietrich, Thomas Käsebier, Uwe Zeitner
Proceedings Volume 11031, 1103109 (2019) https://doi.org/10.1117/12.2520432
KEYWORDS: Photodiodes, Silicon, Mirrors, Absorption, Back illuminated sensors, Quantum efficiency, Photodetectors, Short wave infrared radiation, Germanium

Proceedings Article | 31 October 2016 Paper
Jinyu Li, Huoyao Chen, Stefanie Kroker, Thomas Käsebier, Zhengkun Liu, Keqiang Qiu, Ying Liu, Ernst-Bernhard Kley, Xiangdong Xu, Yilin Hong, Shaojun Fu
Proceedings Volume 10022, 100220T (2016) https://doi.org/10.1117/12.2246381
KEYWORDS: Electron beam lithography, Antireflective coatings, Lithography, Near field, Photomasks, Interfaces, Reflectivity, Glasses, Diffraction, Stray light

Proceedings Article | 31 October 2016 Paper
Dakui Lin, Huoyao Chen, Stefanie Kroker, Thomas Käsebier, Zhengkun Liu, Keqiang Qiu, Ying Liu, Ernst-Bernhard Kley, Xiangdong Xu, Yilin Hong, Shaojun Fu
Proceedings Volume 10022, 100220S (2016) https://doi.org/10.1117/12.2246356
KEYWORDS: Lithography, X-rays, Silica, Photomasks, X-ray lithography, Electron beam lithography, Optical design, Electron beams, Photoresist materials, Diffraction

Proceedings Article | 15 September 2016 Paper
Proceedings Volume 9927, 992704 (2016) https://doi.org/10.1117/12.2236293
KEYWORDS: Silicon, Antireflective coatings, Mid-IR, Reactive ion etching, Interfaces, Etching, Transmittance, Coating, Optics manufacturing, Scattering

Showing 5 of 21 publications
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