Thomas Köhler
at Deutsche Bank AG
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 July 2003 Paper
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Microelectromechanical systems, Sensors, Polymers, Metals, Interfaces, Silicon, Silver, Resistance, Platinum, Photoresist materials

Proceedings Article | 7 June 2002 Paper
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Diamond, Scattering, Crystals, Nitrogen, Nondestructive evaluation, Doping, Chemical vapor deposition, Semiconductor lasers, Boron, Temperature metrology

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