Thorsten Bothe
at Bremer Institut für Angewandte Strahltechnik
SPIE Involvement:
Author
Publications (17)

Proceedings Article | 2 August 2010 Paper
Proc. SPIE. 7791, Interferometry XV: Applications
KEYWORDS: Nondestructive evaluation, Ultrasonography, Shearography, Optical metrology, Reflectometry, Reflection, Pulsed laser operation, Interferometry, Mirrors, Phase measurement

Proceedings Article | 21 August 2009 Paper
Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III
KEYWORDS: Mirrors, Reflection, Cameras, Image processing, Imaging systems, Reflectivity, Interferometers, Silicon, Phase measurement, Phase shifting

Proceedings Article | 7 March 2006 Paper
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Fractal analysis, Sensors, Inspection, Image resolution, Feature extraction, Image sensors, Ceramics, Image segmentation, Shape analysis, Tolerancing

Proceedings Article | 17 November 2005 Paper
Proc. SPIE. 5999, Intelligent Systems in Design and Manufacturing VI
KEYWORDS: Cameras, Reflection, Manufacturing, Inspection, Shearography, Distance measurement, Stereoscopic cameras, Imaging systems, Projection systems, Lamps

SPIE Journal Paper | 1 October 2004
OE Vol. 43 Issue 10
KEYWORDS: Fractal analysis, Sensors, Projection systems, Wavelets, Inspection, Cameras, Detection and tracking algorithms, Tolerancing, Optical engineering, Image resolution

Showing 5 of 17 publications
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