Tim Betker
at Leibniz Univ Hannover
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2020 Presentation + Paper
Proceedings Volume 11352, 113520C (2020) https://doi.org/10.1117/12.2556061
KEYWORDS: Projection systems, 3D metrology, Image registration, 3D image processing, 3D modeling

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