Dr. Tino Hofmann
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | 26 January 2019
OE Vol. 58 Issue 01
KEYWORDS: Microlens, Antireflective coatings, Reflection, Reflectivity, Transmittance, Multiphoton lithography, Spherical lenses, FT-IR spectroscopy, Scanning electron microscopy, Lithium

Proceedings Article | 7 March 2006 Paper
Proc. SPIE. 6120, Terahertz and Gigahertz Electronics and Photonics V
KEYWORDS: Ellipsometry, Data modeling, Dielectrics, Gallium arsenide, Zinc, Magnetism, Terahertz radiation, Far infrared, Manganese, Selenium

Proceedings Article | 9 July 2003 Paper
Proc. SPIE. 5218, Complex Mediums IV: Beyond Linear Isotropic Dielectrics
KEYWORDS: Semiconductors, Surface plasmons, Reflection, Dielectrics, Interfaces, Wave propagation, Infrared radiation, Phonons, Polaritons, Plasma

Proceedings Article | 11 November 2002 Paper
Proc. SPIE. 4779, Advanced Characterization Techniques for Optical, Semiconductor, and Data Storage Components
KEYWORDS: Semiconductors, Ellipsometry, Data modeling, Dielectrics, Gallium arsenide, Magnetism, Picosecond phenomena, Molybdenum, Magnetic semiconductors, Dielectric polarization

Proceedings Article | 24 June 2002 Paper
Proc. SPIE. 4806, Complex Mediums III: Beyond Linear Isotropic Dielectrics
KEYWORDS: Thin films, Ellipsometry, Data modeling, Crystals, Dielectrics, Gallium nitride, Phonons, Picosecond phenomena, Gallium, Anisotropy

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