Tobias Helk
at Friedrich-Schiller-Univ Jena
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 9 September 2019 Presentation + Paper
M. Zürch, F. Tuitje, T. Helk, J. Gautier, F. Tissandier, J. -P. Goddet, E. Oliva, A. Guggenmos, U. Kleineberg, H. Stiel, S. Sebban, C. Spielmann
Proceedings Volume 11111, 111110F (2019) https://doi.org/10.1117/12.2532063
KEYWORDS: Plasma, Extreme ultraviolet, Diffraction, X-rays, Optical amplifiers, X-ray imaging

Proceedings Article | 4 March 2019 Presentation + Paper
Proceedings Volume 10903, 109030A (2019) https://doi.org/10.1117/12.2506610
KEYWORDS: Plasma, Mirrors, Picosecond phenomena, X-ray lasers, Extreme ultraviolet, Wave propagation, Diffraction, Ions, Wavefronts, Computational imaging

Proceedings Article | 4 March 2019 Paper
Proceedings Volume 10890, 1089029 (2019) https://doi.org/10.1117/12.2507211
KEYWORDS: Extreme ultraviolet, Diffraction, Beam splitters, Sensors, Image resolution, Absorption, Cameras, Quantum imaging systems, Biological research, Cell biology

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