Dr. Tobias Seyler
at Fraunhofer IPM
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 7 September 2018 Paper
Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology
KEYWORDS: Confocal microscopy, Holograms, Digital holography, Interferometers, Sensors, Surface roughness, Deconvolution

Proceedings Article | 26 June 2017 Paper
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Phase shifting, Holography, Digital holography, Interferometers, Cameras, Sensors, Image processing, Image resolution, Laser beam propagation, Wave propagation, 3D metrology, Fiber coupled lasers

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top