Dr. Tobias Stuerzer Profile

Dr. Tobias Stuerzer

at Bruker AXS GmbH

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 1 September 2021 Presentation + Paper

B. Becker, J. Kaercher, M. Krug, S. Leo, T. Stuerzer, B. Weinhausen, R. Durst

Proceedings Volume 11838, 118380N (2021) https://doi.org/10.1117/12.2597029

KEYWORDS: Sensors, X-rays, Photon counting, X-ray detectors, Photodetectors, X-ray diffraction, Signal detection, Scintillators

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