Todd Embree
Senior Technologist at Sandia National Labs
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 1 September 2015 Paper
Proc. SPIE. 9613, Polarization Science and Remote Sensing VII
KEYWORDS: Signal to noise ratio, Titanium dioxide, Polarization, Sensors, Coating, Polarimetry, Humidity, Chemical detection, Chemical analysis, Prototyping

Proceedings Article | 15 October 2012 Paper
Proc. SPIE. 8491, Optical System Alignment, Tolerancing, and Verification VI
KEYWORDS: Short wave infrared radiation, Optical design, Beam splitters, Imaging systems, Sensors, Silicon, Objectives, Optical alignment, Modulation transfer functions, Tolerancing

Proceedings Article | 14 September 2001 Paper
Proc. SPIE. 4346, Optical Microlithography XIV
KEYWORDS: Deep ultraviolet, Birefringence, Calcium, Nitrogen, Beam delivery, Adaptive optics, Optical testing, Wavefront distortions, Optical damage, Absorption

Proceedings Article | 12 April 2001 Paper
Proc. SPIE. 4347, Laser-Induced Damage in Optical Materials: 2000
KEYWORDS: Semiconductors, FT-IR spectroscopy, Silica, Birefringence, Manufacturing, Adaptive optics, Distortion, Excimer lasers, Wavefront distortions, Absorption

Proceedings Article | 5 July 2000 Paper
Proc. SPIE. 4000, Optical Microlithography XIII
KEYWORDS: Optical components, Fabry–Perot interferometers, Optical lithography, Sensors, Laser applications, Control systems, Laser stabilization, Optics manufacturing, Pulsed power, 193nm lithography

Showing 5 of 6 publications
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