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Tom Weibezahl
Chief Executive Officer
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Publications (1)
Proceedings Article | 1 June 1994 Paper
Characterization testing of monolithic dual-beam visible diode lasers with a 50-um channel separation
Thomas Weibezahl, William Mosby, G. Kovacs
Proceedings Volume 2148, (1994) https://doi.org/10.1117/12.176636
KEYWORDS: Semiconductor lasers, Temperature metrology, Pulsed laser operation, Heatsinks, Modulation, Laser systems engineering, Laser development, Laser scanners, Continuous wave operation, Photodetectors
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