Dr. Toru Fujii Profile

Dr. Toru Fujii

Manager at Nikon Corp

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Publications (10)

Proceedings Article | 4 March 2019 Paper

Multispectral Mueller matrix imaging dark-field microscope for biological sample observation

Naooki Saito, Kenji Sato, Toru Fujii, Heather Durko, Goldie Goldstein, Alton Phillips, Joceline Dominguez-Cooks, Gabrielle Hutchens, Photini Rice, Jennifer Barton, Harrison Thurgood

Proceedings Volume 10890, 108901A (2019) https://doi.org/10.1117/12.2508109

KEYWORDS: Tissues, Polarimetry, Microscopes, Polarization, Imaging systems, Calibration, Colon, Tissue optics, Objectives, Multispectral imaging

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Proceedings Article | 4 March 2019 Paper

Polarization characteristics of dark-field microscopic polarimetric images of human colon tissue

Toru Fujii, Photini F. Rice, Gabrielle Hutchens, Harrison Thurgood, Joceline Dominguez-Cooks, Swati Chandra, Valentine Nfonsam, Jennifer Barton, Yasuko Yamasaki, Naooki Saito, Masayasu Sawada, Ryo Narita, Taku Saito, Heather Durko

Proceedings Volume 10890, 108902J (2019) https://doi.org/10.1117/12.2509000

KEYWORDS: Tissues, Principal component analysis, Cancer, Polarimetry, Colon, Polarization, Tumors, Microscopes, Tissue optics, Neodymium

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Proceedings Article | 4 March 2010 Paper

Experimental result of polarization characteristics separation method

Toru Fujii, Masayasu Sawada, Kiyoshi Toyama, Kosuke Suzuki, Jun Kogo, Kunihisa Sasada

Proceedings Volume 7640, 76400R (2010) https://doi.org/10.1117/12.846323

KEYWORDS: Polarization, Optical testing, Wavefronts, Lithography, Singular optics, Sensors, Calibration, Projection systems, Jones matrices, Birefringence

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Proceedings Article | 16 March 2009 Paper

True polarization characteristics of hyper-NA optics excluding impact of measurement system

Ken-ichi Muramatsu, Noriyuki Matsuo, Yasihiro Ohmura, Masayasu Sawada, Toru Fujii

Proceedings Volume 7274, 72743K (2009) https://doi.org/10.1117/12.813611

KEYWORDS: Birefringence, Polarization, Optical testing, Projection systems, Crystals, Wavefronts, Lithography, Optical simulations, Matrices, Signal attenuation

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Proceedings Article | 7 March 2008 Paper

Polarization characteristics of state-of-art lithography optics reconstructed from on-body measurement

Kosuke Suzuki, Toru Fujii, Masayasu Sawada, Jun Kogo

Proceedings Volume 6924, 69240Z (2008) https://doi.org/10.1117/12.771812

KEYWORDS: Polarization, Wavefronts, Lithography, Matrices, Optical testing, Projection systems, Phase measurement, Adaptive optics, Fiber optic illuminators, Integrated optics

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Proceedings Article | 27 March 2007 Paper

Polarization properties of state-of-art lithography optics represented by first canonical coordinate of Lie group

Yasuhiro Ohmura, Yuji Kudo, Naonori Kita, Jun Kogo, Kosuke Suzuki, Toru Fujii, Yasushi Mizuno, Masayasu Sawada

Proceedings Volume 6520, 65204W (2007) https://doi.org/10.1117/12.710784

KEYWORDS: Polarization, Matrices, Lithography, Birefringence, Projection systems, Optical lithography, Wavefronts, Crystals, Jones matrices, Signal attenuation

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Proceedings Article | 24 March 2006 Paper

Integrated projecting optics tester for inspection of immersion ArF scanner

Yasushi Mizuno, Toru Fujii, Naonori Kita, Kosuke Suzuki

Proceedings Volume 6152, 615237 (2006) https://doi.org/10.1117/12.656025

KEYWORDS: Polarization, Wavefronts, Scanners, Calibration, Optical testing, Sensors, Wavefront sensors, Charge-coupled devices, Integrated optics, Inspection

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Proceedings Article | 10 May 2005 Paper

On board polarization measuring instrument for high NA excimer scanner

Toru Fujii, Naonori Kita, Yasushi Mizuno

Proceedings Volume 5752, (2005) https://doi.org/10.1117/12.598378

KEYWORDS: Polarization, Polarimetry, Scanners, Fiber optic illuminators, Wave plates, Calibration, Excimers, Light sources, Digital signal processing, Polarization control

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Proceedings Article | 26 June 2003 Paper

Theoretical consideration on quantum lithography with conventional projection

Toru Fujii, Hisao Osawa, Naoki Fukutake, Hiroshi Ooki

Proceedings Volume 5040, (2003) https://doi.org/10.1117/12.485335

KEYWORDS: Lithography, Absorption, Photomasks, Diffraction, Light sources, Interferometry, Interferometers, Crystals, Reticles, Optical lithography

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Proceedings Article | 2 June 2003 Paper

Portable phase measuring interferometer using Shack-Hartmann method

Hiroshi Ooki, Toru Fujii, Yasushi Mizuno, Masato Hamatani, Jun Kougo

Proceedings Volume 5038, (2003) https://doi.org/10.1117/12.482699

KEYWORDS: Wavefronts, Charge-coupled devices, Wavefront sensors, Inspection, Calibration, Phase interferometry, Interferometers, Objectives, Reticles, Semiconducting wafers

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Showing 5 of 10 publications

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