Prof. Toru Yoshizawa Profile

Prof. Toru Yoshizawa

at Tokyo Univ of Agriculture and Technology

SPIE Involvement:

Conference Co-Chair | Editor | Author

Publications (99)

Proceedings Article | 2 November 2018 Paper

Dimensional measurement of internal profile using the optical caliper

Lianhua Jin, Nobuto Miyatsu, Eiichi Kondoh, Bernard Gelloz, Naobumi Kanazawa, Toru Yoshizawa

Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V

KEYWORDS: Geometrical optics, Image filtering, Optical testing, Image processing, Optics manufacturing, Optical instrument design

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Proceedings Article | 13 November 2014 Paper

Compact camera for 3D position registration of cancer in radiation treatment

Toshitaka Wakayama, Shun Hiratsuka, Yoshihisa Kamakura, Katsumasa Nakamura, Toru Yoshizawa

Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III

KEYWORDS: 3D metrology, Cancer, Fringe analysis, Stereoscopic cameras, Cameras, Oncology, Radiotherapy, Semiconductor lasers, Mirrors, Projection systems

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Proceedings Article | 28 May 2014 Paper

Optical center alignment technique based on inner profile measurement method

Toshitaka Wakayama, Toru Yoshizawa

Proc. SPIE. 9110, Dimensional Optical Metrology and Inspection for Practical Applications III

KEYWORDS: Optical alignment, Ellipsometry, CCD cameras, Semiconductor lasers, Optics manufacturing, Mirrors, Receivers, Beam shaping, Spindles, Inspection

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SPIE Journal Paper | 9 April 2014

High-speed three-dimensional shape measurements using multiwavelength spatiotemporal phase shifting

Toshitaka Wakayama, Toru Yoshizawa

OE Vol. 53 Issue 11

KEYWORDS: 3D metrology, Phase shifts, Fringe analysis, Phase shifting, Projection systems, Semiconductor lasers, Digital Light Processing, Cameras, Mirrors, RGB color model

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Proceedings Article | 27 September 2013 Paper

Evaluation of Mueller matrix of achromatic axially symmetric wave plate

Toshitaka Wakayama, Kazuki Komaki, Israel Vaughn, J. Scott Tyo, Yukitoshi Otani, Toru Yoshizawa

Proc. SPIE. 8873, Polarization Science and Remote Sensing VI

KEYWORDS: Wave plates, Polarization, Polarizers, Silica, Polarimetry, Reflection, Polishing, Biomedical optics, Dispersion, Optical components

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Proceedings Article | 6 September 2013 Paper

Uni-axial inner profile measurement

Toshitaka Wakayama, Toru Yoshizawa

Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II

KEYWORDS: Mirrors, Beam shaping, Charge-coupled devices, CCD cameras, Optical fibers, 3D metrology, Semiconductor lasers, Light sources, Beam splitters, Polarizers

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Proceedings Article | 25 June 2013 Paper

State of the art of compact optical 3D profile measurement apparatuses: from outer surface to inner surface measurement

Toru Yoshizawa, Toshitaka Wakayama

Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)

KEYWORDS: Mirrors, Microelectromechanical systems, 3D metrology, Cameras, Optical fibers, Semiconductor lasers, CCD cameras, Projection systems, Collimation, Optical testing

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Proceedings Article | 20 November 2012 Paper

Small size probe for inner profile measurement of pipes using optical fiber ring beam device

Toshitaka Wakayama, Kizuku Machi, Toru Yoshizawa

Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II

KEYWORDS: Mirrors, Optical fibers, Charge-coupled devices, Indium nitride, Collimators, Inspection, Ions, Cameras, Optical testing, 3D metrology

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Proceedings Article | 13 September 2012 Paper

An interferometric observation of topological effect by novel axially symmetrical wave plate

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis

KEYWORDS: Polarization, Spiral phase plates, Optical vortices, Wave plates, Polarizers, Interferometry, Silica, Polymethylmethacrylate, Optical components, Manufacturing

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SPIE Journal Paper | 31 January 2012

Compact camera for three-dimensional profilometry incorporating a single MEMS mirror

Toshitaka Wakayama, Toru Yoshizawa

OE Vol. 51 Issue 1

KEYWORDS: Mirrors, Microelectromechanical systems, Cameras, Stereoscopic cameras, Semiconductor lasers, Projection systems, LCDs, 3D metrology, CCD cameras, Calibration

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Proceedings Article | 14 September 2011 Paper

Development of a probe for inner profile measurement and flaw detection

Toru Yoshizawa, Toshitaka Wakayama, Yoshihisa Kamakura

Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications

KEYWORDS: Inspection, Mirrors, Cameras, Glasses, Optical components, Defect inspection, Semiconductor lasers, Prisms, Optical testing, CCD cameras

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Proceedings Article | 10 September 2011 Paper

Color pattern projection method for three-dimensional measurement

Toshitaka Wakayama, Toru Yoshizawa

Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications

KEYWORDS: 3D metrology, Microelectromechanical systems, Mirrors, Cameras, Semiconductor lasers, Image sensors, Projection systems, Time metrology, Digital micromirror devices, Stereoscopic cameras

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Proceedings Article | 11 November 2010 Paper

Development of an inner profile measurement instrument using a ring beam device

T. Yoshizawa, T. Wakayama

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Mirrors, Cameras, Glasses, Inspection, Semiconductor lasers, Optical components, Medicine, CCD cameras, CMOS cameras, Dentistry

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Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and other industrial applications. Here we describe recent development of our measurement principle for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without using any contact type stylus. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In our hitherto trial experimental works, the availability of this instrument has been evaluated in many cases and availability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disk-like light sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument at this point. Both the ring beam device and a miniaturized CCD camera are fabricated into a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose potentially possible method for measurement of external profile at the same time with internal profile. If one pair of concave mirrors are used in our arrangement, external profile is captured. In combination with inner profile measurement technique, simultaneous measurement of inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of here proposed principle. In addition, we are trying to extend our technique to check defects and/or flaws on the inner wall of pipe-like objects.

Proceedings Article | 11 November 2010 Paper

A palm-top camera for 3D profilometry incorporating a MEMS scanner

T. Yoshizawa, T. Wakayama

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Cameras, Microelectromechanical systems, 3D metrology, 3D scanning, Semiconductor lasers, Laser scanners, Stereoscopic cameras, Image sensors, Scanners, Mirrors

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Proceedings Article | 11 November 2010 Paper

Spectroscopic topological Stokes polarimeter

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proc. SPIE. 7855, Optical Metrology and Inspection for Industrial Applications

KEYWORDS: Polarimetry, Polarization, Spectroscopy, Wave plates, Polarizers, Birefringence, Light sources, Charge-coupled devices, Optical alignment, Spiral phase plates

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Proceedings Article | 3 August 2010 Paper

Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shifter

Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Shuugo Watanabe, Manabu Harada, Toru Yoshizawa

Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis

KEYWORDS: 3D metrology, Liquid crystals, Distance measurement, Phase shifting, CCD cameras, Microscopes, Lens design, Bessel functions, Phase shifts, Calibration

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Proceedings Article | 24 November 2009 Paper

Compact camera system for 3D profile measurement

Toru Yoshizawa, Toshitaka Wakayama

Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology

KEYWORDS: Microelectromechanical systems, Mirrors, 3D metrology, Stereoscopic cameras, Cameras, Phase shifts, Imaging systems, Projection systems, Scanners, Liquid crystals

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Proceedings Article | 24 November 2009 Paper

Measurement of inner and/or outer profiles of pipes using ring beam devices

T. Wakayama, T. Yoshizawa

Proc. SPIE. 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology

KEYWORDS: Mirrors, Cameras, Glasses, Inspection, Optical components, Semiconductor lasers, CMOS cameras, Refractive index, Medicine, Dentistry

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Inner profile measurement is an important matter in such fields as medicine, dentistry and anthropology as well as mechanical engineering and industry. Here we propose a measurement method for inner diameter of pipes and/or holes. The key device in this technique is a ring beam device which consists of a conical mirror and a laser diode. And the fundamental principle is based on optical sectioning without any contact probe. The optically sectioned profile of an inner wall of a pipe-like object is analyzed to give the inner profile in addition to the inner diameter. This optical instrument with a simple and small configuration is now under development for practical uses. In the hitherto-tried experimental works, the availability of this instrument has been highly evaluated and usability for practical applications is expected, especially, for measurement and inspection of mechanical components and elements besides pipes. This ring beam device consisting of a conical mirror and a LD is assembled to form a disklike light beam sheet. We show measurement result of pipes and holes, and, at the same time, report a compact inner profile measuring instrument. Both the ring beam device and a miniaturized CCD camera are fabricated in a glass tube. Availability of this instrument is shown by measuring the inner profiles of various pipes. In response to this trial, there appeared a strong request that not only the internal but external profiles should be measured simultaneously. Therefore we propose an improved method for measuring the external profile in addition to the internal profile. In our arrangement, one pair of concaved conical mirrors is used for the external profile measurement. In combination with the inner profile measurement technique, simultaneous measurement of the inner and outer profiles becomes attainable. A measurement result on a bevel gear shows availability of newly proposed principle. Now we are aiming to realize simultaneous measurement of the internal and external profiles of various types of pipes and similar objects.

Proceedings Article | 10 September 2009 Paper

Three-dimensional profilometry system incorporating a MEMS scanner

Toru Yoshizawa, Toshitaka Wakayama

Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries

KEYWORDS: Microelectromechanical systems, Mirrors, 3D scanning, 3D metrology, Projection systems, Laser scanners, Scanners, Imaging systems, Stereoscopic cameras, Cameras

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Proceedings Article | 10 September 2009 Paper

Three-dimensional profilometry based on focus method by projecting LC grating pattern

Yukitoshi Otani, Fumio Kobayashi, Yasuhiro Mizutani, Toru Yoshizawa

Proc. SPIE. 7432, Optical Inspection and Metrology for Non-Optics Industries

KEYWORDS: Liquid crystals, 3D metrology, Phase shifting, Distance measurement, Phase shifts, Liquids, Optics manufacturing, Microscopes, Liquid lenses, Bessel functions

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Proceedings Article | 12 August 2009 Paper

Axisymmetrical Mueller matrix polarimeter

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proc. SPIE. 7461, Polarization Science and Remote Sensing IV

KEYWORDS: Polarimetry, Sensors, Polarization, Modulation, Polarizers, Wave plates, CCD image sensors, CCD cameras, Mirrors, Axicons

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Proceedings Article | 17 November 2008 Paper

Generation of vortex spectra based on geometric phase for optical tweezers

Toshitaka Wakayama, Yukitoshi Otani, Toru Yoshizawa

Proc. SPIE. 7266, Optomechatronic Technologies 2008

KEYWORDS: Optical tweezers, Spatial light modulators, Polarizers, Polarization, Wave plates, Spiral phase plates, Geometrical optics, Particles, Dielectric polarization, Light sources

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Proceedings Article | 29 August 2008 Paper

Simultaneous measurement of internal and external profiles using a ring beam device

Toshitaka Wakayama, Toru Yoshizawa

Proc. SPIE. 7066, Two- and Three-Dimensional Methods for Inspection and Metrology VI

KEYWORDS: Mirrors, Cameras, 3D metrology, Inspection, Beam shaping, Glasses, Semiconductor lasers, CCD cameras, Precision measurement, Optical testing

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Proceedings Article | 11 August 2008 Paper

Moiré topography using a liquid-crystal-grating based frequency modulation technique

Fumio Kobayashi, Yukitoshi Otani, Toru Yoshizawa

Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis

KEYWORDS: Liquid crystals, Frequency modulation, Binary data, CCD cameras, Moire patterns, Lenses, Light sources, Phase shifts, 3D metrology, Modulation

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Proceedings Article | 10 October 2007 Paper

Development of a compact inner profile measuring instrument

T. Wakayama, H. Takano, T. Yoshizawa

Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V

KEYWORDS: Cameras, Glasses, Mirrors, Inspection, Optical components, Semiconductor lasers, Refractive index, Calibration, Error analysis, CMOS sensors

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Proceedings Article | 10 October 2007 Paper

Applications of a MEMS scanner to profile measurement

Toru Yoshizawa, Toshitaka Wakayama, Hiroshi Takano

Proc. SPIE. 6762, Two- and Three-Dimensional Methods for Inspection and Metrology V

KEYWORDS: Microelectromechanical systems, Mirrors, Scanners, 3D scanning, 3D metrology, Binary data, Phase shifts, Laser scanners, Fringe analysis, Manufacturing

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Proceedings Article | 19 October 2006 Paper

Light-driven micromanipulator and its application for 3D fabrications

Yukitoshi Otani, Yuji Hirai, Yasuhiro Mizutani, Norihiro Umeda, Toru Yoshizawa

Proc. SPIE. 6374, Optomechatronic Actuators, Manipulation, and Systems Control

KEYWORDS: Optical fibers, Photothermal effect, Actuators, Optical actuators, Particles, Glasses, Finite element methods, 3D applications, Magnetism, 3D metrology

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Proceedings Article | 12 October 2006 Paper

Inner profile measurement of pipes and holes using a ring beam device

Toru Yoshizawa, Masayuki Yamamoto, Toshitaka Wakayama

Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV

KEYWORDS: Mirrors, Inspection, CCD cameras, Cameras, Prisms, Optical fabrication equipment, Polishing, Optical testing, Charge-coupled devices, Liquids

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Proceedings Article | 12 October 2006 Paper

White light displacement sensor by spectro-polarization modulator

Yukitoshi Otani, Toshitaka Wakayama, Dmitry Orlov, Norihiro Umeda, Toru Yoshizawa

Proc. SPIE. 6382, Two- and Three-Dimensional Methods for Inspection and Metrology IV

KEYWORDS: Polarization, Modulators, Sensors, Spectroscopy, Optical sensors, Wave plates, Polarizers, Chromatic aberrations, Spectroscopes, Light sources

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Proceedings Article | 7 March 2006 Paper

Three-dimensional profilometry using moire pattern projection

Toru Yoshizawa, Takayoshi Yamaguchi, Masayuki Yamamoto, Yukitoshi Otani

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Moire patterns, Binary data, Phase shifts, 3D metrology, Phase shifting, Liquid crystals, Prototyping, Fringe analysis, Phase measurement, Electronics

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SPIE Journal Paper | 1 March 2006

Two-dimensional measurement of birefringence dispersion using spectroscopic polarized light

Toshitaka Wakayama, Hiroyuki Kowa, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

OE Vol. 45 Issue 03

KEYWORDS: Birefringence, Spectroscopy, Polarizers, Quartz, Modulation, Optical engineering, Wave plates, CCD cameras, Acousto-optics, Tunable filters

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Proceedings Article | 7 November 2005 Paper

Three-dimensional shape measurement using focus method by liquid crystal grating and liquid varifocus lens

Yasuhiro Mizutani, Ryoichi Kuwano, Yukitoshi Otani, Norihiro Umeda, Toru Yoshizawa

Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III

KEYWORDS: Liquids, Liquid lenses, Liquid crystals, Phase shifts, Phase shifting, 3D metrology, Inspection, Mirrors, Distance measurement, Sensors

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Proceedings Article | 7 November 2005 Paper

Surface profile measurement by grating projection method with dual-projection optics

Masayuki Yamamoto, Toru Yoshizawa

Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III

KEYWORDS: Calibration, Cameras, Liquid crystals, Image processing, 3D image processing, Projection systems, Phase measurement, Software, Reflectivity, Time metrology

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Proceedings Article | 7 November 2005 Paper

Liquid crystal grating for profilmetry using structured light

Toru Yoshizawa, Hiroo Fujita

Proc. SPIE. 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III

KEYWORDS: Liquid crystals, Phase shifting, Transmittance, Projection systems, 3D metrology, Modulation, Binary data, Time metrology, Glasses, Structured light

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Proceedings Article | 19 August 2005 Paper

Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern

Toru Yoshizawa, Masayuki Yamamoto, Takahiro Ikeda

Proc. SPIE. 5880, Optical Diagnostics

KEYWORDS: Medical research, Fringe analysis, Speckle pattern, Mouth, Teeth, Mechanical engineering, Life sciences, Skin, CCD cameras, Image processing

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SPIE Journal Paper | 1 January 2005

Optimizing design of high-resolution optical encoder using a point-source light-emitting diode with slits

Yuji Matsuzoe, Kazuhiro Koizumi, Tetsuya Saitoh, Toru Yoshizawa

OE Vol. 44 Issue 01

KEYWORDS: Computer programming, Light emitting diodes, Diffraction gratings, Light sources, Photodetectors, Optical design, Optical encoders, Light, Temperature metrology, Diffraction

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Proceedings Article | 25 October 2004 Paper

Two-dimensional actuator using temperature-sensitive ferrite driven by light beam

Yukitoshi Otani, Yasuhiro Mizutani, Norihiro Umeda, Toru Yoshizawa

Proc. SPIE. 5602, Optomechatronic Sensors, Actuators, and Control

KEYWORDS: Actuators, Optical actuators, Magnetism, Laser optics, Photothermal effect, Semiconductor lasers, Opto mechatronics, Light sources and illumination, Temperature metrology, Optical simulations

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Proceedings Article | 23 October 2003 Paper

Three-dimensional imaging using liquid crystal grating projection

Toru Yoshizawa, Hiroo Fujita, Yukitoshi Otani, Masayuki Yamamoto

Proc. SPIE. 5202, Optical Information Systems

KEYWORDS: Liquid crystals, Phase shifting, 3D image processing, Modulation, Transmittance, Projection systems, 3D metrology, Binary data, CCD cameras, Eye

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Proceedings Article | 30 September 2003 Paper

Micromanipulator by photothermal effect

Yukitoshi Otani, Yasuto Matsuba, Shigeya Chimura, Norihiro Umeda, Toru Yoshizawa

Proc. SPIE. 5264, Optomechatronic Systems IV

KEYWORDS: Optical fibers, Photothermal effect, Optical actuators, Microlens, Actuators, Magnetism, Photography, Opto mechatronics, Quartz, Glasses

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SPIE Journal Paper | 1 July 2003

Research on solidification of resin in stereolithography

Shigeru Nagamori, Toru Yoshizawa

OE Vol. 42 Issue 07

KEYWORDS: Solids, Manufacturing, Stereolithography, Signal attenuation, 3D modeling, Laser scanners, Data modeling, Glasses, Optical engineering, Laser irradiation

Proceedings Article | 29 April 2003 Paper

Research on shape of solidified resin in stereo-lithography

Shigeru Nagamori, Toru Yoshizawa

Proc. SPIE. 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002

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Proceedings Article | 29 April 2003 Paper

Three-dimensional profilometry using liquid crystal grating

Hiroo Fujita, Ken Yamatan, Masayuki Yamamoto, Yukitoshi Otani, Akira Suguro, Shigeru Morokawa, Toru Yoshizawa

Proc. SPIE. 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002

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SPIE Journal Paper | 1 January 2003

High-performance absolute rotary encoder using multitrack and M-code

Yuji Matsuzoe, Nobuhiko Tsuji, Tomoharu Nakayama, Koetsu Fujita, Toru Yoshizawa

OE Vol. 42 Issue 01

KEYWORDS: Computer programming, Photodetectors, Signal detection, Distortion, Optical encoders, Binary data, Light emitting diodes, Optical engineering, Transistors, Sensors

Proceedings Article | 18 October 2002 Paper

Miniaturized machine moving in a pipe using photothermal effect

Toru Yoshizawa, Tomohiko Usui, Masayuki Yamamoto, Daisuke Hayashi