Dr. Toshihiro Tsuji
at AIST
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 July 2003 Paper
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Nanotechnology, Crystals, Silicon, Reliability, Nondestructive evaluation, Atomic force microscopy, Ultrasonics, Vibrometry, Solids, Finite element methods

Proceedings Article | 7 June 2002 Paper
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Lithium, Remote sensing, Reliability, Image resolution, Nondestructive evaluation, Atomic force microscopy, Ultrasonics, Nanomaterials

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