Uriel Hanuka
at Bar-Ilan Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 2 March 2020 Paper
Proceedings Volume 11267, 1126706 (2020) https://doi.org/10.1117/12.2545949
KEYWORDS: Refractive index, Waveguides, Crystals, Silicon, Semiconductor lasers, Scanning electron microscopy, Refraction, Silicon photonics, Semiconducting wafers, Absorption

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top