Dr. Praveen K. Velpula
at UGC-DAE Consortium for Scientific Research
SPIE Involvement:
Author
Area of Expertise:
Sub-picosecond Laser Induced Damage Threshold , Ultrafast Imaging and Ultrafast Processes , Ultrafast beam Engineering , Ultrafast laser-Material Processing , Ultrafast Dynamics
Websites:
Profile Summary

My research in past several years has focused mainly on laser-material processing, laser damage, ultrafast beam engineering, and ultrafast dynamics.

My key achievements in the field:
1) Localization of the light well below the diffraction limit (sub-micron scales) in dielectrics.
2) Ultrafast laser induced 3-D nano structuring in bulk dielectrics.
3) Ultrafast imaging of nano structuring and free carrier dynamics on the formation of positive and negative index structures formation.
4) Study of laser-induced damage threshold (LIDT) of various optical components for ELI's petawatt class lasers.
5) Development of two color/single color pump-probe microscopy.
6) Development of high vacuum LIDT test station.
7) Optical and structural surface cleanliness and verification.
Publications (10)

Proceedings Article | 8 June 2023 Presentation
Nikita Khodakovskiy, Supriya Rajhans, Esmerando Escoto, Praveen Velpula, Bonaventura Farace, Rob Shalloo, Kristjan Poder, Jens Osterhoff, Wim Leemans, Ingmar Hartl, Christoph Heyl
Proceedings Volume PC12577, PC125770F (2023) https://doi.org/10.1117/12.2669587
KEYWORDS: Ultrafast phenomena, Picosecond phenomena, Pulse signals, Nonlinear transmission, Neon, Mirrors, Medicine, Materials science, Laser systems engineering, Laser applications

Proceedings Article | 2 December 2022 Presentation + Paper
Proceedings Volume 12300, 123000H (2022) https://doi.org/10.1117/12.2642134
KEYWORDS: Mirrors, Laser induced damage, Manufacturing, Optical coatings, Optics manufacturing, Dielectrics, Sputter deposition, Dielectric mirrors, Femtosecond lasers

SPIE Journal Paper | 19 May 2020
OE, Vol. 59, Issue 05, 056108, (May 2020) https://doi.org/10.1117/12.10.1117/1.OE.59.5.056108
KEYWORDS: Glasses, Laser damage threshold, Resistance, Femtosecond phenomena, Laser systems engineering, Laser induced damage, Polarization, Reflectivity, Chemical vapor deposition, Thin film coatings

Proceedings Article | 26 April 2019 Presentation + Paper
Proceedings Volume 11034, 110340P (2019) https://doi.org/10.1117/12.2523070
KEYWORDS: Glasses, Laser damage threshold, Absorbance, Thin film coatings, Laser systems engineering, Reflectivity, High power lasers, Laser induced damage

Proceedings Article | 26 June 2017 Presentation + Paper
B. Rus, P. Bakule, D. Kramer, J. Naylon, J. Thoma, M. Fibrich, J. Green, J. C. Lagron, R. Antipenkov, J. Bartoníček, F. Batysta, R. Baše, R. Boge, S. Buck, J. Cupal, M. A. Drouin, M. Ďurák, B. Himmel, T. Havlíček, P. Homer, A. Honsa, M. Horáček, P. Hríbek, J Hubáček, Z. Hubka, G. Kalinchenko, K. Kasl, L. Indra, P. Korous, M. Košelja, L. Koubíková, M. Laub, T. Mazanec, A. Meadows, J. Novák, D. Peceli, J. Polan, D. Snopek, V. Šobr, P. Trojek, B. Tykalewicz, P. Velpula, E. Verhagen, Š. Vyhlídka, J. Weiss, C. Haefner, A. Bayramian, S. Betts, A. Erlandson, J. Jarboe, G. Johnson, J. Horner, D. Kim, E. Koh, C. Marshall, D. Mason, E. Sistrunk, D. Smith, T. Spinka, J. Stanley, C. Stolz, T. Suratwala, S. Telford, T. Ditmire, E. Gaul, M. Donovan, C. Frederickson, G. Friedman, D. Hammond, D. Hidinger, G. Chériaux, A. Jochmann, M. Kepler, C. Malato, M. Martinez, T. Metzger, M. Schultze, P. Mason, K. Ertel, A. Lintern, C. Edwards, C. Hernandez-Gomez, J. Collier
Proceedings Volume 10241, 102410J (2017) https://doi.org/10.1117/12.2269818
KEYWORDS: Laser systems engineering, Optical amplifiers, Pulsed laser operation, Semiconductor lasers, Laser development, Laser applications, Cryogenics, Oscillators, Amplifiers, Picosecond phenomena

Showing 5 of 10 publications
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