Prof. Vasco M. Teixeira Profile

Prof. Vasco M. Teixeira

at Univ do Minho

SPIE Involvement:

Author

Publications (9)

Proceedings Article | 21 October 2011 Paper

Assessment of residual stress on thin films by laser microtopography

Manuel F. M. Costa, V. Teixeira

Proceedings Volume 8011, 801112 (2011) https://doi.org/10.1117/12.902212

KEYWORDS: Inspection, Sensors, Thin films, Thin film coatings, Optical coatings, Glasses, Active optics, Thin film deposition, Spherical lenses, Nondestructive evaluation

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SPIE Journal Paper | 1 June 2008

Microtopographic inspection of laser-glazed thermal barrier coatings

Manuel Costa, C. Batista, A. Portinha, Vasco Teixeira, C. Oliveira, Ricardo Mendes Ribeiro

OE, Vol. 47, Issue 06, 063603, (June 2008) https://doi.org/10.1117/12.10.1117/1.2946698

KEYWORDS: Inspection, Optical coatings, Surface roughness, Thin film coatings, Laser processing, Laser scanners, Scanning electron microscopy, Optical engineering, Laser therapeutics, Resistance

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Proceedings Article | 1 February 2006 Paper

Micro electronic and macro optical parameters of the ITO films prepared by DC sputtering for electrochromic applications

H. Cui, V. Teixeira, Li-Jian Meng, E. Fortunato

Proceedings Volume 6034, 603407 (2006) https://doi.org/10.1117/12.668090

KEYWORDS: Oxygen, Refractive index, Sputter deposition, Scattering, Annealing, Thin films, Light scattering, Dielectrics, Diffuse reflectance spectroscopy, Indium

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Proceedings Article | 1 February 2006 Paper

The optical properties of titanium oxide films prepared by dc reactive magnetron sputtering

Li-Jian Meng, V. Teixeira, H. Cui, Frank Placido, Z. Xu, M. dos Santos

Proceedings Volume 6034, 603409 (2006) https://doi.org/10.1117/12.668092

KEYWORDS: Sputter deposition, Transmittance, Refractive index, Light scattering, Optical properties, Glasses, Reflectivity, Titanium, Oxides, Thin films

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Proceedings Article | 19 November 2003 Paper

Microtopographic inspection of laser processed titanium thin coatings

Manuel Costa, Vasco Teixeira, Ricardo Mendes Ribeiro

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.531216

KEYWORDS: Titanium, Inspection, Laser processing, Carbon dioxide lasers, Control systems, Interference filters, Thin films, Active optics, Osmium, Laser therapeutics

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Proceedings Article | 19 November 2003 Paper

Electrochromic tungsten oxide multilayer thin films for use in smart windows

H. Cui, Manuel Costa, Vasco Teixeira, I. Porqueras, E. Bertran

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.530727

KEYWORDS: Tungsten, Thin films, Oxides, Multilayers, Oxygen, Transmittance, Thin film coatings, Glasses, Transparency, Annealing

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Proceedings Article | 14 August 2001 Paper

Microtopographic characterization of graded Cr-Cr2O3 cermet solar coatings

Manuel Costa, Vasco Teixeira

Proceedings Volume 4419, (2001) https://doi.org/10.1117/12.437107

KEYWORDS: Optical coatings, Inspection, Solar energy, Oxides, Aluminum, Thin film coatings, Solar cells, Sputter deposition, Metals, Multilayers

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Proceedings Article | 15 December 2000 Paper

Noninvasive optical topographic evaluation of Cr-Cr2O3 cermet solar absorbers

Manuel Costa, Vasco Teixeira, Clarisse Nunes, A. Monteiro

Proceedings Volume 4087, (2000) https://doi.org/10.1117/12.406443

KEYWORDS: Inspection, Optical coatings, Solar energy, Solar cells, Oxides, Thin film coatings, Aluminum, Metals, Multilayers, Optical properties

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Proceedings Article | 11 October 1999 Paper

Microtopographic inspection of Cr-Cr2O3 cermet solar absorbers

Manuel Costa, Vasco Teixeira, Clarisse Nunes

Proceedings Volume 3789, (1999) https://doi.org/10.1117/12.367561

KEYWORDS: Inspection, Optical coatings, Solar energy, Linear filtering, Solar cells, Oxides, Thin film coatings, Metals, Multilayers, Sputter deposition

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Showing 5 of 9 publications

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