Venumadhav Vedula
at Philips Electronics India Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 24 August 2006 Paper
Proceedings Volume 6312, 63121C (2006) https://doi.org/10.1117/12.673373
KEYWORDS: Image registration, Nondestructive evaluation, Inspection, Data modeling, Computed tomography, Data fusion, Clouds, Computer aided diagnosis and therapy, Algorithm development, Solid modeling

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