Dr. Victoria A. Coleman
Research Scientist at National Measurement Institute of Australia
SPIE Involvement:
Author | Editor
Publications (5)

Proceedings Article | 16 September 2014 Paper
Ana Andres-Arroyo, Scott Kemp, Wen Jun Toe, Fan Wang, Victoria Coleman, Peter Reece
Proceedings Volume 9164, 91641I (2014) https://doi.org/10.1117/12.2062465
KEYWORDS: Optical tweezers, Gold, Spectroscopy, Nanoparticles, Particles, Surface plasmons, Transmission electron microscopy, Scattering, Relays, Nanorods

Proceedings Article | 20 September 2011 Paper
Victoria Coleman, Åsa Jämting, Heather Catchpoole, Maitreyee Roy, Jan Herrmann
Proceedings Volume 8105, 810504 (2011) https://doi.org/10.1117/12.894297
KEYWORDS: Particles, Transmission electron microscopy, Nanoparticles, Calibration, Gold, Resonators, Metrology, Dynamic light scattering, Solids, Sensors

Proceedings Article | 3 June 2010 Paper
Malcolm Lawn, Jan Herrmann, Christopher Freund, John Miles, Malcolm Gray, Daniel Shaddock, Victoria Coleman, Asa Jämting
Proceedings Volume 7729, 77290L (2010) https://doi.org/10.1117/12.853788
KEYWORDS: Metrology, Interferometers, Mirrors, Scanning probe microscopy, Interferometry, Scanning probe microscopes, Oscillators, Heterodyning, Laser interferometry, Standards development

Proceedings Article | 3 June 2010 Paper
A. La Fontaine, V. Coleman, A. Jämting, M. Lawn, J. Herrmann, J. Miles
Proceedings Volume 7729, 77290Q (2010) https://doi.org/10.1117/12.853772
KEYWORDS: Particles, Zinc oxide, Transmission electron microscopy, Nanoparticles, Chemical analysis, Statistical analysis, Microscopy, Sodium, Calcium, Titanium dioxide

Proceedings Article | 21 August 2009 Paper
Victoria Coleman, Arnaud La Fontaine, Toni Endmann, Åsa Jämting, Jan Herrmann, John Miles
Proceedings Volume 7405, 74050B (2009) https://doi.org/10.1117/12.825713
KEYWORDS: Particles, Zinc oxide, Nanoparticles, Transmission electron microscopy, Metrology, Manufacturing, Water, Dynamic light scattering, Statistical analysis, Sodium

Proceedings Volume Editor (2)

Conference Committee Involvement (3)
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
13 August 2012 | San Diego, California, United States
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
24 August 2011 | San Diego, California, United States
Instrumentation, Metrology, and Standards for Nanomanufacturing IV
2 August 2010 | San Diego, California, United States
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