Dr. Vishal Sipani
Sr Manager at Micron Technology Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 March 2008 Paper
Vishal Sipani, David Kewley, Kaveri Jain, Erik Byers, Bruce Daybell, Anthony Krauth
Proceedings Volume 6923, 69233O (2008) https://doi.org/10.1117/12.773316
KEYWORDS: Reticles, Photoresist materials, Critical dimension metrology, Optical lithography, Photoresist processing, Fluorine, Semiconducting wafers, Polymers, Molecules, Diffusion

Proceedings Article | 11 April 2006 Paper
Vishal Sipani, Yoshi Hishiro, Mirzafer Abatchev
Proceedings Volume 6153, 61532U (2006) https://doi.org/10.1117/12.659102
KEYWORDS: Etching, Silicon, Plasmas, Chemical vapor deposition, Photoresist materials, Reflectivity, Oxides, Silicon carbide, Polymers, Semiconducting wafers

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