Vladimir Terekhov
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 December 2016 Paper
Proceedings Volume 10224, 102241C (2016) https://doi.org/10.1117/12.2266750
KEYWORDS: Microelectromechanical systems, Particles, Fractal analysis, Ions, Electrons, Dielectrics, Silicon, Neon, Computer simulations, Semiconductors

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