Volker Schmidt
at Berliner Glas GmbH
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 17 April 2014 Paper
Renate Müller, Kanstantin Afanasiev, Marcel Ziemann, Volker Schmidt
Proceedings Volume 9048, 90482E (2014) https://doi.org/10.1117/12.2046209
KEYWORDS: Semiconducting wafers, Glasses, Manufacturing, Lithography, Particles, Thermal effects, 3D metrology, 3D modeling, Interferometers, Distortion

Proceedings Article | 23 March 2010 Paper
M. Ziemann, S. Voss, O. Baldus, V. Schmidt
Proceedings Volume 7636, 76362F (2010) https://doi.org/10.1117/12.839840
KEYWORDS: Semiconducting wafers, Glasses, Silicon, Dielectrics, Calibration, Electrodes, Interferometers, Reticles, Lithography, Semiconductors

Proceedings Article | 12 April 2005 Paper
Volker Schmidt, Winfried Arens
Proceedings Volume 5708, (2005) https://doi.org/10.1117/12.591079
KEYWORDS: Mirrors, Manufacturing, Optics manufacturing, Surface finishing, Polishing, Lightweight mirrors, Silica, Adhesives, Laser applications, Space mirrors

Proceedings Article | 15 January 2003 Paper
Volker Schmidt, Winfried Arens, Ulrich Kriems
Proceedings Volume 4979, (2003) https://doi.org/10.1117/12.479559
KEYWORDS: Glasses, Semiconducting wafers, Etching, Ion beams, Wet etching, Reactive ion etching, Photomasks, Semiconductors, Polymethylmethacrylate, Surface finishing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top