Dr. Wansong Li
at Vereinigte Elektronik-Werkstätten GmbH (VEW)
SPIE Involvement:
Author
Publications (15)

Proceedings Article | 18 August 2014 Paper
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Actuators, Monochromatic aberrations, Mirrors, Fringe analysis, Cameras, Calibration, Error analysis, Reflectivity, Deflectometry, Phase measurement

Proceedings Article | 13 September 2012 Paper
Proc. SPIE. 8494, Interferometry XVI: Applications
KEYWORDS: Confocal microscopy, Mirrors, Data modeling, Cameras, Sensors, Error analysis, Optical testing, Deflectometry, Distance measurement, 3D metrology

Proceedings Article | 10 September 2004 Paper
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Mirrors, Reflection, Imaging systems, Cameras, Calibration, Particles, Error analysis, Inspection, Image resolution, 3D metrology

Proceedings Article | 10 September 2004 Paper
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Reflection, Sensors, Fourier transforms, Wavefront sensors, Feature extraction, Optical metrology, Data processing, 3D metrology, Shearography, Data integration

Proceedings Article | 30 May 2003 Paper
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Phase shifting, Modulation, Cameras, Image processing, Inspection, Phase shift keying, Augmented reality, 3D metrology, Projection systems, Phase measurement

Showing 5 of 15 publications
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