Wei Yin
at Nanjing Univ. of Science and Technology
SPIE Involvement:
Author
Publications (24)

Proceedings Article | 27 September 2024 Paper
Long Yin, Wei Yin
Proceedings Volume 13282, 132820A (2024) https://doi.org/10.1117/12.3044724
KEYWORDS: Phase unwrapping, Stereoscopy, 3D metrology, Fringe analysis, Imaging systems, Phase shifts, Stereo vision systems, Phase recovery, Phase measurement

SPIE Journal Paper | 17 May 2023 Open Access
APN, Vol. 2, Issue 03, 036010, (May 2023) https://doi.org/10.1117/12.10.1117/1.APN.2.3.036010
KEYWORDS: Education and training, Data modeling, Deep learning, Optical metrology, Fringe analysis, Visual process modeling, Feature extraction, Photonics, Performance modeling, Error analysis

Proceedings Article | 21 December 2022 Poster
Proceedings Volume 12319, 1231915 (2022) https://doi.org/10.1117/12.2642326
KEYWORDS: Fringe analysis, Network security, Optical metrology, Phase retrieval, Mobile devices, Holograms

Proceedings Article | 19 December 2022 Poster + Paper
Proceedings Volume 12319, 1231916 (2022) https://doi.org/10.1117/12.2642327
KEYWORDS: Speckle, 3D metrology, 3D modeling, Infrared radiation, Sensors, Infrared sensors, Image information entropy, 3D image reconstruction, Digital filtering, Detection and tracking algorithms

Proceedings Article | 19 December 2022 Poster + Paper
Proceedings Volume 12319, 1231918 (2022) https://doi.org/10.1117/12.2642331
KEYWORDS: Defect detection, Light sources and illumination, Image fusion, Detection and tracking algorithms, Reflectivity, Machine vision, Optical inspection

Showing 5 of 24 publications
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