Dr. Wei Zhou Profile

Dr. Wei Zhou

CTO at MLOptic Corp

SPIE Involvement:

Conference Program Committee | Author | Instructor | Science Fair Judge

Proceedings Article | 13 March 2024 Presentation + Paper

Wavefront calibration and multi-configurable measurements

Pengfei Wu, Will Zhou, Lucy Chu, Sean Huentelman

Proceedings Volume 12909, 129090P (2024) https://doi.org/10.1117/12.3018446

KEYWORDS: Wavefronts, Calibration, Adaptive optics, Sensors, Interferometers, Design, Spatial resolution, Optical metrology

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Proceedings Article | 12 March 2024 Poster + Paper

A six-dimensional optical sensing in a single system

Sophia Wu, Will Zhou, Sean Huentelman

Proceedings Volume 12870, 1287009 (2024) https://doi.org/10.1117/12.3021060

KEYWORDS: Sensors, Cameras, Target detection, Laser optics, Optical imaging, Collimation, Design, Beam splitters, Position sensors, Mirror surfaces

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Proceedings Article | 11 March 2024 Poster + Paper

A scheme to automatically allocate the optical apparatus’ pupil in 6-axis space

Bailing Hou, Kailing Chen, Teresa Zhang, Jiang He, Wei Zhou

Proceedings Volume 12893, 1289319 (2024) https://doi.org/10.1117/12.3012052

KEYWORDS: Sensors, Optical alignment, Data modeling, 3D modeling, Equipment, Virtual reality, Optical metrology, Environmental sensing, Optical fabrication, Optical components

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Proceedings Article | 8 March 2023 Presentation + Paper

A high-sensitivity, quantitative method to detect micro-scale optics' internal defects and impurity

Jiang He, Teresa Zhang, Wei Zhou

Proceedings Volume 12428, 1242808 (2023) https://doi.org/10.1117/12.2645703

KEYWORDS: Cameras, Imaging systems, Light sources, Integrating spheres, Biomedical optics, Data centers, Sensors, Inspection, Colorimetry, Signal processing

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Proceedings Article | 3 October 2022 Open Access

Learning and thoughts of how industrial internship can inspire new generation talents

Teresa Zhang, Jiang He, Wei Zhou

Proceedings Volume 12213, 122130J (2022) https://doi.org/10.1117/12.2635162

KEYWORDS: Internships, Outreach programs, Electrical engineering, Mathematics, Photonics, Patents, Scanning transmission electron microscopy, Mathematical modeling, Analytical research, System integration

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Proceedings Article | 3 October 2022 Presentation + Paper

A self-adaptive calibration tool for periscope of AR/VR glass binocular disparity measurement

Jiang He, Wei Zhou, Pengfei Wu

Proceedings Volume 12222, 122220C (2022) https://doi.org/10.1117/12.2635145

KEYWORDS: Calibration, Collimators, Glasses, Feedback signals, Laser beam diagnostics, Eye, Autoregressive models, Prototyping, Cameras, Neodymium

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Proceedings Article | 3 October 2022 Presentation + Paper

An optical apparatus to enable absolute angular alignment for sampling-based MTF test equipment

Teresa Zhang, Jiang He, Wei Zhou

Proceedings Volume 12222, 122220B (2022) https://doi.org/10.1117/12.2635131

KEYWORDS: Beam splitters, Mirrors, Optical alignment, Modulation transfer functions, Visualization, Optical calibration, Optical testing equipment, Optical components, Light sources, Optical metrology

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Proceedings Article | 23 July 2022 Paper

A high through-put image colorimeter for ultra-high-resolution micro-led panel inspection

Wei Zhou, Jiang He, Xinyu Peng

Proceedings Volume 12277, 122770S (2022) https://doi.org/10.1117/12.2614080

KEYWORDS: Calibration, Inspection, Spectral calibration, Image resolution, Image processing, Spectral resolution, Process control, Optical resolution, Optical filters, Optical filtering

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Proceedings Article | 9 March 2022 Presentation

A novel imaging system for large FOV AR/VR glass optical resolution test

Pengfei Wu, Konstantin Kudinov, Omar Pualuan, Siyuan Liang, Will Zhou, Jiang He

Proceedings Volume PC12024, PC1202402 (2022) https://doi.org/10.1117/12.2614558

KEYWORDS: Glasses, Sensors, Optical resolution, Optical testing, Imaging systems, Metrology, Manufacturing, Design for manufacturability, Optical sensors, Optical design

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Proceedings Article | 5 March 2022 Presentation

A generic optical metrology platform for AR/VR

Will Zhou, Jiang He, Pengfei Wu, Wei Wang, Nathan Yang, Tang Song

Proceedings Volume PC12008, PC1200805 (2022) https://doi.org/10.1117/12.2614074

KEYWORDS: Optical metrology, Metrology, Product engineering, Optics manufacturing, Optical design, Design for manufacturability, Waveguides, Projection systems, Precision optics, Optical calibration

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Proceedings Article | 20 September 2013 Paper

Illumination design for semiconductor backlight inspection and application extensions

Wei Zhou, Todd Rutherford, Darcy Hart

Proceedings Volume 8819, 881908 (2013) https://doi.org/10.1117/12.2026967

KEYWORDS: Light emitting diodes, Collimators, Semiconducting wafers, Semiconductors, Inspection, Geometrical optics, Collimation, Waveguides, Manufacturing, Silicon

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Proceedings Article | 20 September 2013 Paper

New generation CMOS 2D imager evaluation and qualification for semiconductor inspection applications

Wei Zhou, Darcy Hart

Proceedings Volume 8819, 881907 (2013) https://doi.org/10.1117/12.2026963

KEYWORDS: Cameras, Inspection, Semiconductors, Image resolution, Sensors, Imaging systems, CMOS technology, Signal to noise ratio, Neodymium, Content addressable memory

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Proceedings Article | 6 April 2012 Paper

Technology review for silicon imagers-based see-through-silicon inspection and metrology

Wei Zhou, Max Guest, Darcy Hart

Proceedings Volume 8324, 83241Q (2012) https://doi.org/10.1117/12.918500

KEYWORDS: Cameras, Imaging systems, Silicon, Inspection, Indium gallium arsenide, Signal to noise ratio, Semiconducting wafers, Metrology, Device simulation, Semiconductors

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Proceedings Article | 24 September 2011 Paper

Laser dark-field illumination system modeling for semiconductor inspection applications

Wei Zhou, Darcy Hart, Rajiv Roy

Proceedings Volume 8170, 81700P (2011) https://doi.org/10.1117/12.902234

KEYWORDS: Photons, Semiconducting wafers, Semiconductor lasers, Systems modeling, Semiconductors, Inspection, Microscopes, Laser beam propagation, Signal detection, Laser applications

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Proceedings Article | 20 September 2011 Paper

See-through-silicon inspection application studies based on traditional silicon imager

Wei Zhou, Darcy Hart, Noah Bock, Rolf Shervey

Proceedings Volume 8105, 81050H (2011) https://doi.org/10.1117/12.892576

KEYWORDS: Signal to noise ratio, Silicon, Image processing, Inspection, Sensors, Semiconducting wafers, Machine vision, Reflection, Imaging systems, Human vision and color perception

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Proceedings Article | 27 September 2007 Paper

GRIN-optics-based hyperspectral imaging micro-sensor

Wei Zhou, James Leger

Proceedings Volume 6765, 676502 (2007) https://doi.org/10.1117/12.754011

KEYWORDS: Channel projecting optics, GRIN lenses, Diffraction gratings, Sensors, Spectroscopy, Hyperspectral imaging, Optical design, Diffraction, Etching, Image sensors

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Showing 5 of 16 publications

Conference Committee Involvement (5)

Optical System Alignment, Tolerancing, and Verification XV

18 August 2024 | San Diego, California, United States

Optical System Alignment, Tolerancing, and Verification XIV

21 August 2022 | San Diego, California, United States

Instrumentation, Metrology, and Standards for Nanomanufacturing VIII

20 August 2014 | San Diego, California, United States

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

28 August 2013 | San Diego, California, United States

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

13 August 2012 | San Diego, California, United States

Course Instructor

SC1310: Optical Metrology for AR/VR/MR

This course explains basic principles and applications of optical metrology for AR/VR/MR. A primary goal of the course is to reveal the logic of optical methodologies as being critical to the design verification and production yield improvement for this revolutionary consumer electronics product. The class will explore current AR/VR development challenges and how cutting-edge optical metrology technologies are used to boost this fast-growing industry. Out of this course the audience will be able to comfortably describe the fundamental demands of optical metrology for this industry and confidently define a solution path for a particular application.

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