Prof. Wen-Ching Hsieh Profile

Prof. Wen-Ching Hsieh

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 30 August 2006 Paper

SONOS sensor for measurement of gamma-ray irradiation

Wen-Ching Hsieh, Daniel Lee Hao-Tien, Hong-Sheng Xu

Proceedings Volume 6319, 63190W (2006) https://doi.org/10.1117/12.680860

KEYWORDS: Gamma radiation, Sensors, Dielectrics, Semiconductors, Silicon, Electrons, Molybdenum, Oxides, Electronics, Roads

Read Abstract +

In comparison with traditional sensors, semiconductor dosimeters have certain advantages because of their high sensitivity, small sizes and weights and simple readout. However in case of the MOS type Gamma radiation sensors, stored dosage data was easily volatile at high temperature. A typical Si-Oxide-Nitride-Oxide-Si (SONOS) device processed by semiconductor technology can be a candidate for nonvolatile Gamma Radiation sensors. The Gamma ray radiation induces a significant decrease of threshold voltage for SONOS. The change of threshold voltage after Gamma ray expose can be correlated to the dose of Gamma ray exposure as well. This SONOS type of Gamma radiation sensor, has the following characteristics :(1) the stored dose recorded in this SONOS device is always nonvolatile during data read and write, even at high temperature. (2) Data in the SONOS can be erased to original null state by charges injection, but it can't be annealed by high temperature. (3) Data can be accumulatively stored in the SONOS.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years